Polymeric thin shells: Measurement of elastic properties at the nanometer scale using atomic force microscopy

2009 ◽  
Vol 165 (3) ◽  
pp. 231-234 ◽  
Author(s):  
Emmanouil Glynos ◽  
Vassilis Sboros ◽  
Vasileios Koutsos
Keyword(s):  
Atomic Force Microscopy ◽  
Elastic Properties ◽  
Nanometer Scale ◽  
Thin Shells ◽  
Force Microscopy ◽  
Atomic Force

Elastic properties and breaking strengths of GaS, GaSe and GaTe nanosheets

Nanoscale ◽  
2018 ◽  
Vol 10 (27) ◽  
pp. 13022-13027 ◽  
Author(s):  
Basant Chitara ◽  
Assaf Ya'akobovitz
Keyword(s):  
Atomic Force Microscopy ◽  
Young’S Modulus ◽  
Elastic Properties ◽  
Young's Modulus ◽  
Force Microscopy ◽  
Atomic Force ◽  
Maximal Strain

The present study highlights the elastic properties of suspended GaS, GaSe and GaTe nanosheets using atomic force microscopy. GaS exhibited the highest Young's modulus (∼173 GPa) among these nanosheets. These materials can withstand maximal stresses of up to 8 GPa and a maximal strain of 7% before breaking, making them suitable for stretchable electronic and optomechanical devices.

scholarly journals Assessing dystrophies and other muscle diseases at the nanometer scale by atomic force microscopy

Nanomedicine ◽  
2014 ◽  
Vol 9 (4) ◽  
pp. 393-406 ◽  
Author(s):  
Ruthger W van Zwieten ◽  
Stefania Puttini ◽  
Małgorzata Lekka ◽  
Guillaume Witz ◽  
Evelyne Gicquel-Zouida ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Nanometer Scale ◽  
Muscle Diseases ◽  
Force Microscopy ◽  
Atomic Force

Elastic Properties of Living COS Cells Analyzed by Atomic Force Microscopy

2002 ◽  
Vol 3 (2-3) ◽  
pp. 161-161
Author(s):  
X. Wang ◽  
H. Hirling ◽  
R. Marsault ◽  
B. Huni ◽  
G. Dietler ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Elastic Properties ◽  
Force Microscopy ◽  
Cos Cells ◽  
Atomic Force

scholarly journals Nanometer-scale electrical characterization of stressed ultrathin SiO2 films using conducting atomic force microscopy

2001 ◽  
Vol 78 (26) ◽  
pp. 4181-4183 ◽  
Author(s):  
M. Porti ◽  
M. Nafrı́a ◽  
X. Aymerich ◽  
A. Olbrich ◽  
B. Ebersberger
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Characterization ◽  
Nanometer Scale ◽  
Sio2 Films ◽  
Force Microscopy ◽  
Atomic Force
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