Microwave Atomic Force Microscopy: Quantitative Measurement and Characterization of Electrical Properties on the Nanometer Scale

2011 ◽  
Vol 5 (1) ◽  
pp. 016602 ◽  
Author(s):  
Lan Zhang ◽  
Yang Ju ◽  
Atsushi Hosoi ◽  
Akifumi Fujimoto
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Properties ◽  
Quantitative Measurement ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Atomic Force

Characterization of the Electrical Properties of Nickel-Based CMSX-4 Super-alloys Using Atomic Force Microscopy (AFM)

2004 ◽  
Vol 10 (S02) ◽  
pp. 1102-1103
Author(s):  
Guangchun Cui ◽  
Rosario A Gerhardt
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Properties ◽  
Force Microscopy ◽  
Atomic Force

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

scholarly journals Nanometer-scale electrical characterization of stressed ultrathin SiO2 films using conducting atomic force microscopy

2001 ◽  
Vol 78 (26) ◽  
pp. 4181-4183 ◽  
Author(s):  
M. Porti ◽  
M. Nafrı́a ◽  
X. Aymerich ◽  
A. Olbrich ◽  
B. Ebersberger
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Characterization ◽  
Nanometer Scale ◽  
Sio2 Films ◽  
Force Microscopy ◽  
Atomic Force

Nanometer-Scale Characterization of Ferroelectric Polymer Thin Films by Variable-Temperature Atomic Force Microscopy

2000 ◽  
Vol 39 (Part 1, No. 6B) ◽  
pp. 3830-3833 ◽  
Author(s):  
Takeshi Fukuma ◽  
Kei Kobayashi ◽  
Toshihisa Horiuchi ◽  
Hirofumi Yamada ◽  
Kazumi Matsushige
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Variable Temperature ◽  
Polymer Thin Films ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Ferroelectric Polymer ◽  
Atomic Force ◽  
Scale Characterization

Atomic Force Microscopy Based Electric Modes in Characterization of Organic Photovoltaics

2013 ◽  
Vol 1500 ◽  
Author(s):  
Craig Wall ◽  
Sergei Magonov ◽  
Sergey Belikov ◽  
John Alexander
Keyword(s):  
Atomic Force Microscopy ◽  
Organic Photovoltaics ◽  
Nanometer Scale ◽  
Structure Property ◽  
Force Microscopy ◽  
Atomic Force ◽  
Combined Use ◽  
Structure Property Relationship ◽  
Electric Force Microscopy

ABSTRACTCapabilities of Atomic Force Microscopy in different modes including Electric Force Microscopy and Kelvin Force Microscopy are reviewed and illustrated on several samples including organic photovoltaics (P3HT/PCBM, PEDOT:PSS). Compositional mapping of these blends is enhanced with a combined use of the modes, and variations of local electric properties are detected down to the nanometer scale. The revealed morphology will assist in development of comprehensive models accounting for the structure-property relationship in solar cells and related devices.

scholarly journals Nanoscale characterization of all-oxide core-shell nanorod heterojunction using intermodulation atomic force microscopy (AFM) methods

2021 ◽  
Author(s):  
Illia Dobryden ◽  
Riccardo Borgani ◽  
Federica Rigoni ◽  
Pedram Ghamgosar ◽  
Isabella Concina ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Properties ◽  
Contact Potential Difference ◽  
Core Shell ◽  
Contact Potential ◽  
Distribution Maps ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanoscale Characterization

The electrical properties of an all-oxide core-shell ZnO-Co3O4 nanorod heterojunction were studied in dark and under UV-vis illumination. The contact potential difference and current distribution maps were obtained utilizing new...

Nanometer scale characterization of polymer films by atomic-force microscopy

2002 ◽  
Vol 181 (1) ◽  
pp. 457-466 ◽  
Author(s):  
Christian Teichert ◽  
Alfred Haas ◽  
Gernot M. Wallner ◽  
Reinhold W. Lang
Keyword(s):  
Atomic Force Microscopy ◽  
Polymer Films ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scale Characterization
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