High accuracy profile measurement of a machined surface by the combined method

Measurement ◽  
1996 ◽  
Vol 19 (1) ◽  
pp. 55-64 ◽  
Author(s):  
Wei Gao ◽  
Satoshi Kiyono
Keyword(s):  
High Accuracy ◽  
Profile Measurement ◽  
Combined Method ◽  
Machined Surface ◽  
Accuracy Profile

scholarly journals High Accuracy Profile Measurement With a New Virtual Multi-Probe Scanning System

IEEE Access ◽  
2020 ◽  
Vol 8 ◽  
pp. 158727-158734
Author(s):  
Ning Chai ◽  
Ziqiang Yin ◽  
Jianhua Yao
Keyword(s):  
High Accuracy ◽  
Scanning System ◽  
Profile Measurement ◽  
Accuracy Profile

Phase error compensation methods for high-accuracy profile measurement

2016 ◽  
Vol 27 (4) ◽  
pp. 045201 ◽  
Author(s):  
Zewei Cai ◽  
Xiaoli Liu ◽  
Xiang Peng ◽  
Zonghua Zhang ◽  
Hao Jiang ◽  
...  
Keyword(s):  
Error Compensation ◽  
Phase Error ◽  
High Accuracy ◽  
Profile Measurement ◽  
Accuracy Profile ◽  
Compensation Methods

scholarly journals Mixed Scheduled Rolling of High Tensile Strength and Mild Steel Using a High-accuracy Profile Model in Hot Strip Finishing Mill

2014 ◽  
Vol 100 (12) ◽  
pp. 1499-1507 ◽  
Author(s):  
Suguhiro Fukushima ◽  
Yoshiro Washikita ◽  
Tamotsu Sasaki ◽  
Shigemasa Nakagawa ◽  
Yasuhiko Buei ◽  
...  
Keyword(s):  
Tensile Strength ◽  
Mild Steel ◽  
High Accuracy ◽  
High Tensile Strength ◽  
Profile Model ◽  
Accuracy Profile ◽  
Hot Strip ◽  
Finishing Mill ◽  
Hot Strip Finishing Mill

scholarly journals Development of high-accuracy profile measuring system for focusing mirror of SOR (Synchrotron Orbital Radiation)

1985 ◽  
Vol 51 (11) ◽  
pp. 2090-2095
Author(s):  
Yuzo MORI ◽  
Toshio HONGO ◽  
Yasuo HIGASHI ◽  
Kazuhisa SUGIYAMA ◽  
Kazuto YAMAUCHI ◽  
...  
Keyword(s):  
High Accuracy ◽  
Measuring System ◽  
Accuracy Profile ◽  
Orbital Radiation

A Technology of Composite Real-Time Image Processing of Profile Measurement

2011 ◽  
Vol 383-390 ◽  
pp. 4884-4888
Author(s):  
Tian Ze Li ◽  
Ke Ping Hu ◽  
Luan Hou ◽  
Chuan Jiang ◽  
Heng Wei Lu ◽  
...  
Keyword(s):  
Image Processing ◽  
Image Analysis ◽  
Real Time ◽  
Laser Scanning ◽  
High Accuracy ◽  
Profile Measurement ◽  
Real Time Image Processing ◽  
Real Time Image ◽  
Image Area ◽  
Time Image

This paper, innovative approaches are based on laser scanning and image analysis, presents an efficient composite technique for object profile extraction with real-time image processing. High throughput is obtained by algorithmic prefiltering to restrict the image area, while high accuracy is achieved by neural recontruction of the profile.

A Circular Profile Measurement Method Using Software Techniques

2005 ◽  
Vol 295-296 ◽  
pp. 265-270 ◽  
Author(s):  
Eiki Okuyama ◽  
Kimiyuki Mitsui
Keyword(s):  
Silicon Wafer ◽  
Measurement Method ◽  
Surface Profile ◽  
Disk Surface ◽  
High Accuracy ◽  
Displacement Sensor ◽  
Profile Measurement ◽  
Reference Surface ◽  
Reference Guide ◽  
Circular Profile

In industry, disk type products with a highly accurate surface such as silicon wafer and hard disk, are important elements. To measure these surfaces, an interferometer is used. However, this method generally needs a highly accurate reference surface. Another method to obtain the disk surface profile is by a scanning displacement sensor. However, the output of this sensor is influenced by the parasitic motions of the scanning along the reference guide. This article presents novel measurement procedures, a reversal method, an improved reversal method and a multi-prove method, to measure the circular profile on a disk without any references but with high accuracy.

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