Theoretical analysis of the atomic force microscopy characterization of columnar thin films

Ultramicroscopy ◽

10.1016/s0304-3991(02)00159-6 ◽

2003 ◽

Vol 94 (1) ◽

pp. 19-29 ◽

Author(s):

Petr Klapetek ◽

Ivan Ohlı́dal

Keyword(s):

Atomic Force Microscopy ◽

Theoretical Analysis ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Characterization ◽

Atomic Force Microscopy Characterization

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Atomic force microscopy characterization of sputtered vanadium oxide thin films grown on Al 2 O 3 substrate

Applied Physics A ◽

10.1007/s003390051321 ◽

1998 ◽

Vol 66 (7) ◽

pp. S1175-S1178

Author(s):

A. Cricenti ◽

M. Girasole ◽

R. Generosi ◽

C. Coluzza ◽

S. Capone ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Vanadium Oxide ◽

Oxide Thin Films ◽

Force Microscopy ◽

Atomic Force ◽

Vanadium Oxide Thin Films ◽

Microscopy Characterization ◽

Atomic Force Microscopy Characterization

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Tunneling atomic force microscopy characterization of cuprous oxide thin films

2011 11th IEEE International Conference on Nanotechnology ◽

10.1109/nano.2011.6144415 ◽

2011 ◽

Author(s):

Brett Castle ◽

Alex Li ◽

Ron Coutu ◽

Robert Hengehold ◽

Joseph Van Nostrand

Keyword(s):

Atomic Force Microscopy ◽

Cuprous Oxide ◽

Oxide Thin Films ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Characterization ◽

Atomic Force Microscopy Characterization

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Atomic Force Microscopy Characterization of ZnTe Epitaxial Thin Films

Japanese Journal of Applied Physics ◽

10.1143/jjap.42.4706 ◽

2003 ◽

Vol 42 (Part 1, No. 7B) ◽

pp. 4706-4709 ◽

Author(s):

Petr Klapetek ◽

Ivan Ohlídal ◽

Alberto Montaigne-Ramil ◽

Alberta Bonanni ◽

David Stifter ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Epitaxial Thin Films ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Characterization ◽

Atomic Force Microscopy Characterization

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Atomic force microscopy characterization of the chemical contrast of nanoscale patterns fabricated by electron beam lithography on polyethylene glycol oxide thin films

Ultramicroscopy ◽

10.1016/j.ultramic.2008.10.022 ◽

2009 ◽

Vol 109 (3) ◽

pp. 222-229 ◽

Author(s):

Lucel Sirghi ◽

Frederic Bretagnol ◽

Stéphane Mornet ◽

Takao Sasaki ◽

Douglas Gilliland ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Electron Beam ◽

Electron Beam Lithography ◽

Force Microscopy ◽

Atomic Force ◽

Nanoscale Patterns ◽

Microscopy Characterization ◽

Atomic Force Microscopy Characterization

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An x-ray photoelectron spectra and atomic force microscopy characterization of silica substrates engineered with a covalently assembled siloxane monolayer

Nanotechnology ◽

10.1088/0957-4484/16/10/033 ◽

2005 ◽

Vol 16 (10) ◽

pp. 2170-2175 ◽

Author(s):

Antonino Gulino ◽

Guglielmo G Condorelli ◽

Placido Mineo ◽

Ignazio Fragalà

Keyword(s):

Atomic Force Microscopy ◽

Photoelectron Spectra ◽

X Ray ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Characterization ◽

Atomic Force Microscopy Characterization ◽

Silica Substrates

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Atomic force microscopy characterization of stable faces in cubic C60 and hexagonal C60, 2CCl4 single crystals

Chemical Physics ◽

10.1016/0301-0104(94)87034-9 ◽

1994 ◽

Vol 179 (3) ◽

pp. 595-605 ◽

Author(s):

Bineta Keita ◽

Louis Nadjo ◽

René Céolin ◽

Viatcheslav Agafonov ◽

Daniel André ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Single Crystals ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Characterization ◽

Atomic Force Microscopy Characterization

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Synthesis and In Situ Atomic Force Microscopy Characterization of Temperature-Responsive Hydrogels Based on Poly(2-(dimethylamino)ethyl methacrylate) Prepared by Atom Transfer Radical Polymerization†

Langmuir ◽

10.1021/la061683k ◽

2007 ◽

Vol 23 (1) ◽

pp. 241-249 ◽

Author(s):

Jinyu Huang ◽

Brian Cusick ◽

Joanna Pietrasik ◽

Li Wang ◽

Tomasz Kowalewski ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Atom Transfer Radical Polymerization ◽

Force Microscopy ◽

Temperature Responsive ◽

Atomic Force ◽

Microscopy Characterization ◽

Responsive Hydrogels ◽

Atomic Force Microscopy Characterization

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Scanning tunneling microscopy and atomic force microscopy characterization of polystyrene spin-coated onto silicon surfaces

Langmuir ◽

10.1021/la00039a030 ◽

1992 ◽

Vol 8 (3) ◽

pp. 920-926 ◽

Author(s):

T. G. Stange ◽

Roy Mathew ◽

D. Fennell Evans ◽

W. A. Hendrickson

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunneling Microscopy ◽

Silicon Surfaces ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Characterization ◽

Atomic Force Microscopy Characterization

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Atomic force microscopy characterization of collagen ‘nanostraws’ in human costal cartilage

Micron ◽

10.1016/j.micron.2012.10.006 ◽

2013 ◽

Vol 44 ◽

pp. 483-487 ◽

Author(s):

M. Stacey ◽

D. Dutta ◽

W. Cao ◽

A. Asmar ◽

H. Elsayed-Ali ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Costal Cartilage ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Characterization ◽

Atomic Force Microscopy Characterization

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Atomic force microscopy characterization of Zerodur mirror substrates for the extreme ultraviolet telescopes aboard NASA's Solar Dynamics Observatory

Applied Optics ◽

10.1364/ao.46.003156 ◽

2007 ◽

Vol 46 (16) ◽

pp. 3156 ◽

Author(s):

Regina Soufli ◽

Sherry L. Baker ◽

David L. Windt ◽

Eric M. Gullikson ◽

Jeff C. Robinson ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Extreme Ultraviolet ◽

Solar Dynamics Observatory ◽

Force Microscopy ◽

Atomic Force ◽

Solar Dynamics ◽

Microscopy Characterization ◽

Atomic Force Microscopy Characterization

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