Scanning tunneling microscopy and atomic force microscopy characterization of polystyrene spin-coated onto silicon surfaces

Langmuir ◽  
1992 ◽  
Vol 8 (3) ◽  
pp. 920-926 ◽  
Author(s):  
T. G. Stange ◽  
Roy Mathew ◽  
D. Fennell Evans ◽  
W. A. Hendrickson
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Tunneling Microscopy ◽  
Silicon Surfaces ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Characterization ◽  
Atomic Force Microscopy Characterization

Local Characterization of Ultrathin ZnO Layers on Ag(111) by Scanning Tunneling Microscopy and Atomic Force Microscopy

2014 ◽  
Vol 118 (47) ◽  
pp. 27428-27435 ◽  
Author(s):  
Akitoshi Shiotari ◽  
Bo Hong Liu ◽  
Simon Jaekel ◽  
Leonhard Grill ◽  
Shamil Shaikhutdinov ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Local Characterization
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