Dependence of electrically detected magnetic resonance signal shape from iron-contaminated silicon wafers on the thermal treatment of the samples
1999 ◽
Vol 273-274
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pp. 404-407
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1999 ◽
Vol 139
(2)
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pp. 422-429
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1994 ◽
Vol 106
(1)
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pp. 32-36
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2015 ◽
Vol 44
(4)
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pp. 203-213
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2000 ◽
Vol 21
(6)
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pp. 366-378
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Keyword(s):
1990 ◽
Vol 38
(10)
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pp. 2687-2697
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2009 ◽
Vol 130
(17)
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pp. 174506
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