Non-contact 3D edge profile measurement for die and mould model surface

2002 ◽  
Vol 127 (2) ◽  
pp. 286-291 ◽  
Author(s):  
Seojoon Lee ◽  
Takashi Miyoshi ◽  
Yasuhiro Takaya ◽  
Satoru Takahashi
2004 ◽  
Vol 70 (700) ◽  
pp. 3556-3563 ◽  
Author(s):  
Panart KHAJORNRUNGRUANG ◽  
Takashi MIYOSHI ◽  
Yasuhiro TAKAYA ◽  
Takashi HARADA ◽  
Soichiro ISAGO

2008 ◽  
Author(s):  
Takemi Asai ◽  
Yoshikazu Arai ◽  
Yuguo Cui ◽  
Wei Gao

2009 ◽  
Vol 69-70 ◽  
pp. 138-142 ◽  
Author(s):  
Yoshikazu Arai ◽  
T. Asai ◽  
Sayeda Ferdous ◽  
Wei Gao

This paper describes an atomic force microscope (AFM) based instrument for 3D edge profile measurement of single-point diamond cutting tools. The instrument is composed of an AFM unit and an optical sensor for alignment of the AFM probe tip (silicon cantilever) with the diamond cutting tool edge. In the optical sensor, a laser beam from a laser diode along the Y-axis is focused to generate a small beam spot with a micrometer-order diameter at the beam waist, and then received by a photo-detector (photodiode). The tool edge top and the AFM probe tip are brought to the center of the beam waist in the XZ-plane through monitoring the variation of the photodiode output, respectively. Consequently, the AFM tip can be aligned with the tool edge top. Alignment experiments and 3D edge profile measurements of a round-nose type single-point diamond tool are carried out.


2005 ◽  
Vol 2005.4 (0) ◽  
pp. 85-86
Author(s):  
Yasuhiro TAKAYA ◽  
Panart KHAJORNRUNGRUANG ◽  
Terutake HAYASHI ◽  
Takashi MIYOSHI

2016 ◽  
Vol 10 (1) ◽  
pp. 106-113 ◽  
Author(s):  
Kenji Maruno ◽  
◽  
Masaki Michihata ◽  
Yasuhiro Mizutani ◽  
Yasuhiro Takaya ◽  
...  

We propose a novel, on-machine method of measuring the profile of the cutting edge of a tool by using the cutting fluid on the tool surface. Despite an environment of on-machine tool profile measurement, it is difficult to measure a cutting edge profile by using conventional optical methods due to interference from the cutting fluid on the tool surface. To overcome this problem, we propose a profile measurement method that uses confocal fluorescent detection from the cutting fluid on the tool surface. Moreover, for precise measurements, a method that corrects for the thickness of the cutting fluid is provided. Fluorescence from the surface of a silicon wafer coated with a fluorescent dye that is set horizontally as well as vertically to the optical axis of a developed fluorescent confocal microscope is detected. As a basic verification, the cutting edge profile of a milling tool with wear is measured using the proposed measuring and correction methods that employ a fluorescent dye. The results confirm that the proposed method can provide detailed measurements of a tool wear profile.


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