Atomic-scale analysis of self-assembled quantum dots by cross-sectional scanning, tunneling microscopy, and atom probe tomography

Quantum Dots ◽  
2012 ◽  
pp. 41-60
Author(s):  
J. G. Keizer ◽  
P. M. Koenraad
Keyword(s):  
Quantum Dots ◽  
Scanning Tunneling Microscopy ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Scale Analysis ◽  
Tunneling Microscopy ◽  
Cross Sectional ◽  
Self Assembled

scholarly journals Capping process of InAs∕GaAs quantum dots studied by cross-sectional scanning tunneling microscopy

2004 ◽  
Vol 85 (23) ◽  
pp. 5697-5699 ◽  
Author(s):  
Q. Gong ◽  
P. Offermans ◽  
R. Nötzel ◽  
P. M. Koenraad ◽  
J. H. Wolter
Keyword(s):  
Quantum Dots ◽  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Cross Sectional

Atomic‐scale view of AlGaAs/GaAs heterostructures with cross‐sectional scanning tunneling microscopy

1993 ◽  
Vol 63 (9) ◽  
pp. 1273-1275 ◽  
Author(s):  
M. B. Johnson ◽  
U. Maier ◽  
H.‐P. Meier ◽  
H. W. M. Salemink
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Cross Sectional
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