Dynamic Dark-Field Electron Microscopy
Dynamic dark-field electron microscopy as described here provides capabilities not present with other methods. An annular ring of any selected diameter is used to illuminate the specimen. Diffraction rings selected by the objective aperture are integrated photographically to produce the dark-field image.All methods of dark-field electron microscopy eliminate the incident illumination from the image and utilize only a selected portion of the scattered electrons and each has its limitations (1):1. Movement of the objective aperture off of the optical axis introduces spherical aberation which increases as the 4th power of the distance from the axis.2. Tilting the beam either mechanically or electrically allows only those electrons scattered in one direction to be imaged.