Electron Microscopy and Structure of Materials
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Published By University Of California Press

9780520323230

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GROWTH AND CHARACTERIZATION OF REFRACTORY OXIDE-METAL COMPOSITES

Electron Microscopy and Structure of Materials ◽

10.1525/9780520323230-054 ◽

1972 ◽

pp. 859-869

Author(s):

R. J. Gerdes ◽

A. T. Chapman

Keyword(s):

Refractory Oxide ◽

Metal Composites

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APPLICATIONS AND RECENT DEVELOPMENTS IN TRANSMISSION ELECTRON MICROSCOPY

Electron Microscopy and Structure of Materials ◽

10.1525/9780520323230-003 ◽

1972 ◽

pp. 23-59

Author(s):

W. L. Bell ◽

G. Thomas

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron ◽

Recent Developments

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HIGH TEMPERATURE SCANNING ELECTRON MICROSCOPY

Electron Microscopy and Structure of Materials ◽

10.1525/9780520323230-020 ◽

1972 ◽

pp. 347-351

Author(s):

Richard M. Fulrath

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

High Temperature ◽

Temperature Scanning ◽

Scanning Electron

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DISLOCATION STRUCTURE AND THE STRENGTH OF TITANIUM

Electron Microscopy and Structure of Materials ◽

10.1525/9780520323230-025 ◽

1972 ◽

pp. 438-469

Author(s):

H. Conrad ◽

K. Okasaki ◽

V. Gadgil ◽

M. Jon

Keyword(s):

Dislocation Structure

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TRANSFORMATIONS INVOLVING COHERENT PHASES AND EFFECTS ON MECHANICAL PROPERTIES OF ALLOYS

Electron Microscopy and Structure of Materials ◽

10.1525/9780520323230-029 ◽

1972 ◽

pp. 505-537

Author(s):

H. Warlimont

Keyword(s):

Mechanical Properties

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RADIATION INDUCED DISTORTION AND SWELLING OF MAGNESIUM

Electron Microscopy and Structure of Materials ◽

10.1525/9780520323230-064 ◽

1972 ◽

pp. 996-1016

Author(s):

E. F. Sturcken ◽

C. W. Krapp

Keyword(s):

Radiation Induced

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ANALYSIS OF MICROSTRUCTURES IN NICKEL-BASE ALLOYS: IMPLICATIONS FOR STRENGTH AND ALLOY DESIGN

Electron Microscopy and Structure of Materials ◽

10.1525/9780520323230-033 ◽

1972 ◽

pp. 566-616

Author(s):

J. M. Oblak ◽

B. H. Kear

Keyword(s):

Alloy Design ◽

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DARK-FIELD ELECTRON MICROSCOPY OF AMORPHOUS SEMICONDUCTORS

Electron Microscopy and Structure of Materials ◽

10.1525/9780520323230-067 ◽

1972 ◽

pp. 1064-1073

Author(s):

M. L. Rudee

Keyword(s):

Electron Microscopy ◽

Amorphous Semiconductors ◽

Field Electron ◽

Field Electron Microscopy ◽

Dark Field Electron

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KILOVOLT ELECTRON ENERGY DISSIPATION vs. PENETRATION DISTANCE IN HIGH ATOMIC NUMBER MATERIALS

Electron Microscopy and Structure of Materials ◽

10.1525/9780520323230-009 ◽

1972 ◽

pp. 171-187

Author(s):

M. S. Chung ◽

W. J. Devore ◽

T. E. Everhart

Keyword(s):

Energy Dissipation ◽

Electron Energy ◽

Atomic Number ◽

Penetration Distance ◽

High Atomic Number

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MICROSTRUCTURE-MECHANICAL PROPERTY-FRACTURE RELATIONSHIPS IN THE ALL-BETA TITANIUM ALLOY Ti-13V-11Cr-3A1

Electron Microscopy and Structure of Materials ◽

10.1525/9780520323230-037 ◽

1972 ◽

pp. 657-666

Author(s):

G. Hari Narayanan ◽

T. F. Archbold

Keyword(s):

Mechanical Property ◽

Titanium Alloy ◽

Beta Titanium Alloy ◽

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