Electronic, mechanical and electron-optical engineering design features of the cambridge university 600 KV high resolution electron microscope

Author(s):  
W.C. Nixon ◽  
H. Ahmed ◽  
C.J.D. Catto ◽  
J.R.A. Cleaver ◽  
K.C.A. Smith ◽  
...  

1. Introduction.The Cambridge University 600 kV high resolution electron microscope has been developed as a joint programme between the Department of Engineering and the Department of Physics. The shorter electron wavelength at 600 kV when compared to 100 kV gives a potential improvement in resolution that can only be realised in practice if the engineering design and construction are also correspondingly improved. Many aspects of this microscope have been developed specifically for this attempt at very high resolution. Some of these aspects were reported in September 1977 at the time when the microscope was first operated (Nixon et al. 1977). After three months operation the present resolution is better than 3 Å with no indication that any fundamental design limit has been approached.The following three items have been purchased outside. All other aspects of the microscope have been designed and constructed in Cambridge University. The high voltage generator and accelerator, as described by Reinhold and Gleyvod (1974), has been supplied by Haefely, Switzerland

1983 ◽  
Vol 130 (2) ◽  
pp. 127-136 ◽  
Author(s):  
David J. Smith ◽  
R. A. Camps ◽  
L. A. Freeman ◽  
R. Hill ◽  
W. C. Nixon ◽  
...  

1982 ◽  
Vol 9 (3) ◽  
pp. 203-213 ◽  
Author(s):  
David J. Smith ◽  
R.A. Camps ◽  
V.E. Cosslett ◽  
L.A. Freeman ◽  
W.O. Saxton ◽  
...  

Author(s):  
Mihir Parikh

It is well known that the resolution of bio-molecules in a high resolution electron microscope depends not just on the physical resolving power of the instrument, but also on the stability of these molecules under the electron beam. Experimentally, the damage to the bio-molecules is commo ly monitored by the decrease in the intensity of the diffraction pattern, or more quantitatively by the decrease in the peaks of an energy loss spectrum. In the latter case the exposure, EC, to decrease the peak intensity from IO to I’O can be related to the molecular dissociation cross-section, σD, by EC = ℓn(IO /I’O) /ℓD. Qu ntitative data on damage cross-sections are just being reported, However, the microscopist needs to know the explicit dependence of damage on: (1) the molecular properties, (2) the density and characteristics of the molecular film and that of the support film, if any, (3) the temperature of the molecular film and (4) certain characteristics of the electron microscope used


Author(s):  
G.Y. Fan ◽  
O.L. Krivanek

Full alignment of a high resolution electron microscope (HREM) requires five parameters to be optimized: the illumination angle (beam tilt) x and y, defocus, and astigmatism magnitude and orientation. Because neither voltage nor current centering lead to the correct illumination angle, all the adjustments must be done on the basis of observing contrast changes in a recorded image. The full alignment can be carried out by a computer which is connected to a suitable image pick-up device and is able to control the microscope, sometimes with greater precision and speed than even a skilled operator can achieve. Two approaches to computer-controlled (automatic) alignment have been investigated. The first is based on measuring the dependence of the overall contrast in the image of a thin amorphous specimen on the relevant parameters, the other on measuring the image shift. Here we report on our progress in developing a new method, which makes use of the full information contained in a computed diffractogram.


Sign in / Sign up

Export Citation Format

Share Document