Inner Shell Ionization by 60 keV Electrons, Application to Microanalysis
1975 ◽
Vol 33
◽
pp. 126-127
Keyword(s):
By using a Castaing-Henry filtering device adapted on a Siemens Elmiskop I electron microscope, we have directly observed plasmon and inner shell excitations by 60 keV electrons on electron energy loss spectra. Inner shell excitation edges have been detected up to 1900 eV.By comparing L and K inner shell excitation profiles in the case of Magnesium, Aluminium and Silicon, it is concluded that the optical selection rules, △1 = ±1, explain the shape of the spectrum after the edge in a first approximation.
1982 ◽
Vol 40
◽
pp. 496-497
1989 ◽
Vol 47
◽
pp. 404-405
1975 ◽
Vol 8
(12)
◽
pp. 1033-1037
◽
1988 ◽
Vol 19
(2)
◽
pp. 73-86
◽
Keyword(s):
1977 ◽
Vol 35
◽
pp. 232-233
◽
1990 ◽
Vol 48
(2)
◽
pp. 82-83