Since many applications of electron energy loss spectroscopy (EELS) deal
with microanalysis of crystalline materials it is relevant to consider the
effects of diffracting conditions on an EELS measurement. It is well known
that anamolous effects can be observed during thin film x-ray microanalysis
when crystalline materials are oriented under diffracting conditions near S
= 0.1-4 It is not surprizing, therefore, that similar
effects will be present in EELS, since this anamolous x-ray generation is a
result of variations in the ionization cross-section with crystalline
orientation2,3. Furthermore since multiple
scattering effects quickly average out these
perturbations2 one expects the most pronounced
effects under conditions appropriate to EELS.5
