Chemical-shift analysis of O Kα by EPMA color-mapping method for BiSrCaCuO superconductive specimen
1992 ◽
Vol 50
(1)
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pp. 82-83
Keyword(s):
The chemical shifts of x-ray spectra are now frequently observed with EPMA (Electron Probe Microanalysis). The conventional method of chemical-shift analysis with EPMA is to compare the peak shapes and peak positions of standard spectra with those of unknown spectra. We reported that O-Kα peak shapes detected by using a TAP (Thallium acid phthalate) crystal reflect their crystal structures. Fig. 1 shows these O-Kα spectral peaks. In the present study, concerning the BiSrCaCuO superconductor made by the sintering method, it was observed that the O-Kα spectra of several kinds of phases reflected their crystal structures. Moreover, it is now possible to observe these chemical shifts of spectra by using the color mapping method in EPMA.
2020 ◽
Vol 22
(4)
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pp. 2319-2326
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2004 ◽
Vol 28
(1)
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pp. 69-79
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2015 ◽
Vol 93
(4)
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pp. 451-458
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2018 ◽
Vol 9
(12)
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pp. 3348-3353
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2012 ◽
Vol 53
(2)
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pp. 139-148
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2017 ◽
Vol 139
(48)
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pp. 17597-17607
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Keyword(s):