High temperature X-ray diffraction study of phase decomposition in rapidly quenched Al–Ge–Si

The phase decomposition occurring during the heating of rapidly quenched Al–Ge–Si alloys has been investigated in situ by means of synchrotron radiation X-ray diffraction. The metastable Al–Ge phases formed in the as-quenched state transform during heating to Al and Ge. The addition of silicon decreases the transformation temperature. A Ge(Si) solid solution is indicated by a systematic change in the lattice constant of Ge as a result of the diffusion of Si from the Al matrix into the phase-separated Ge matrix.