SESAM: Exploring the Frontiers of Electron Microscopy
2006 ◽
Vol 12
(6)
◽
pp. 506-514
◽
Keyword(s):
We report on the sub-electron-volt-sub-angstrom microscope (SESAM), a high-resolution 200-kV FEG-TEM equipped with a monochromator and an in-column MANDOLINE filter. We report on recent results obtained with this instrument, demonstrating its performance (e.g., 87-meV energy resolution at 10-s exposure time, or a transmissivity of the energy filter of T1 eV = 11,000 nm2). New opportunities to do unique experiments that may advance the frontiers of microscopy in areas such as energy-filtered TEM, spectroscopy, energy-filtered electron diffraction and spectroscopic profiling are also discussed.
1989 ◽
Vol 47
◽
pp. 44-45
2003 ◽
Vol 59
(2)
◽
pp. 117-126
◽
2001 ◽
Vol 16
(1)
◽
pp. 101-107
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1998 ◽
Vol 39
(9)
◽
pp. 920-926
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1988 ◽
Vol 156
(2)
◽
pp. 307-314
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2011 ◽
Vol 189-193
◽
pp. 1036-1039
1983 ◽
Vol 10
(2)
◽
pp. 47-54
◽