scholarly journals Site-specific Lift Out Sample Preparation Technique for Atom Probe Analysis

2006 ◽  
Vol 12 (S02) ◽  
pp. 1742-1743 ◽  
Author(s):  
D Lawrence ◽  
K Thompson ◽  
DJ Larson ◽  
B Gorman
Keyword(s):  
Sample Preparation ◽  
Atom Probe ◽  
Preparation Technique ◽  
Site Specific ◽  
Sample Preparation Technique ◽  
Probe Analysis ◽  
Atom Probe Analysis

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

scholarly journals Site-specific Specimen Preparation Technique for Atom Probe Analysis of Grain Boundaries

2006 ◽  
Vol 12 (S02) ◽  
pp. 1740-1741 ◽  
Author(s):  
D Lawrence ◽  
K Thompson ◽  
DJ Larson
Keyword(s):  
Grain Boundaries ◽  
Atom Probe ◽  
Specimen Preparation ◽  
Preparation Technique ◽  
Site Specific ◽  
Probe Analysis ◽  
Atom Probe Analysis

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Site Specific Atom Probe Analysis from Ceramic, Geologic and Bio-Materials

2008 ◽  
Vol 14 (S2) ◽  
pp. 1246-1247
Author(s):  
RL Martens ◽  
MG Thompson ◽  
GB Bersch ◽  
M Forseth ◽  
R Knutson
Keyword(s):  
New Mexico ◽  
Atom Probe ◽  
Site Specific ◽  
Probe Analysis ◽  
Atom Probe Analysis

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

SEM evaluation of the TEM cold-stage double-film specimen

1984 ◽  
Vol 42 ◽  
pp. 272-273
Author(s):  
Jayesh Bellare
Keyword(s):  
Spatial Distribution ◽  
Sample Preparation ◽  
Sample Thickness ◽  
Specimen Preparation ◽  
Preparation Technique ◽  
Liquid Sample ◽  
Thin Specimen ◽  
Sample Preparation Technique ◽  
Cold Stage ◽  
Film Specimen

Seeing is believing, but only after the sample preparation technique has received a systematic study and a full record is made of the treatment the sample gets.For microstructured liquids and suspensions, fast-freeze thermal fixation and cold-stage microscopy is perhaps the least artifact-laden technique. In the double-film specimen preparation technique, a layer of liquid sample is trapped between 100- and 400-mesh polymer (polyimide, PI) coated grids. Blotting against filter paper drains excess liquid and provides a thin specimen, which is fast-frozen by plunging into liquid nitrogen. This frozen sandwich (Fig. 1) is mounted in a cooling holder and viewed in TEM.Though extremely promising for visualization of liquid microstructures, this double-film technique suffers from a) ireproducibility and nonuniformity of sample thickness, b) low yield of imageable grid squares and c) nonuniform spatial distribution of particulates, which results in fewer being imaged.

ATOM-PROBE ANALYSIS OF G.P. ZONES IN AN Al-1.7 at % Cu ALLOY

1987 ◽  
Vol 48 (C6) ◽  
pp. C6-349-C6-354
Author(s):  
K. Hono ◽  
T. Sakurai ◽  
H. W. Pickering
Keyword(s):  
Atom Probe ◽  
Cu Alloy ◽  
Probe Analysis ◽  
Atom Probe Analysis
Sign in / Sign up

Export Citation Format

Share Document