In-Situ Atomic-Resolution Study of Stress-Induced Unusual Large Strain Plasticity of Semiconductor nanowires
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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
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2010 ◽
Vol 654-656
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pp. 2293-2296
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2003 ◽
Vol 22
(3)
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pp. 341-356
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2020 ◽
Vol 121
(14)
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pp. 3048-3065
2015 ◽
Vol 2015.90
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pp. 300
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