Depth Profiling Magnetic Structure Using Scanning Electron Microscopy with Polarization Analysis (SEMPA)
2010 ◽
Vol 16
(S2)
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pp. 1862-1863
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Keyword(s):
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
1993 ◽
Vol 51
◽
pp. 1032-1033
1988 ◽
Vol 6
(3)
◽
pp. 574-575
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1999 ◽
Vol 70
(1)
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pp. 246-247
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1991 ◽
Vol 49
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pp. 764-765
1998 ◽
Vol 34
(4)
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pp. 1165-1167
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1989 ◽
Vol 25
(5)
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pp. 4204-4206
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