Embedded Nanoparticle Analysis using Atom Probe Tomography and High-Resolution Electron Microscopy
2011 ◽
Vol 17
(S2)
◽
pp. 760-761
◽
Keyword(s):
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
2014 ◽
Vol 20
(S3)
◽
pp. 960-961
◽
1990 ◽
Vol 48
(4)
◽
pp. 772-773
1990 ◽
Vol 25
(1)
◽
pp. 157-176
◽
1988 ◽
Vol 98
◽
pp. 197-200
◽
1983 ◽
Vol 41
◽
pp. 738-739
1983 ◽
Vol 41
◽
pp. 730-731