3D Characterization of Pigment Dispersion in Dried Paint Films Using Focused Ion Beam-Scanning Electron Microscopy

2012 ◽  
Vol 18 (S2) ◽  
pp. 614-615
Author(s):  
J. Lin ◽  
W. Heeschen ◽  
J. Reffner ◽  
J. Hook
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Pigment Dispersion ◽  
Beam Scanning ◽  
Paint Films ◽  
Scanning Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Three-Dimensional Characterization of Pigment Dispersion in Dried Paint Films Using Focused Ion Beam–Scanning Electron Microscopy

2012 ◽  
Vol 18 (2) ◽  
pp. 266-271 ◽  
Author(s):  
Jui-Ching Lin ◽  
William Heeschen ◽  
John Reffner ◽  
John Hook
Keyword(s):  
Image Analysis ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Three Dimensional ◽  
Pigment Dispersion ◽  
Beam Scanning ◽  
Quantitative Characterization ◽  
Paint Films ◽  
Scanning Electron

AbstractThe combination of integrated focused ion beam–scanning electron microscope (FIB-SEM) serial sectioning and imaging techniques with image analysis provided quantitative characterization of three-dimensional (3D) pigment dispersion in dried paint films. The focused ion beam in a FIB-SEM dual beam system enables great control in slicing paints, and the sectioning process can be synchronized with SEM imaging providing high quality serial cross-section images for 3D reconstruction. Application of Euclidean distance map and ultimate eroded points image analysis methods can provide quantitative characterization of 3D particle distribution. It is concluded that 3D measurement of binder distribution in paints is effective to characterize the order of pigment dispersion in dried paint films.

Degradation of a Metal–Polymer Interface Observed by Element-Specific Focused Ion Beam-Scanning Electron Microscopy

Langmuir ◽  
2020 ◽  
Vol 36 (11) ◽  
pp. 2816-2822 ◽  
Author(s):  
Takashi Kakubo ◽  
Katsunori Shimizu ◽  
Akemi Kumagai ◽  
Hiroaki Matsumoto ◽  
Miki Tsuchiya ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Beam Scanning ◽  
Polymer Interface ◽  
Metal Polymer ◽  
Scanning Electron

Focused ion beam scanning electron microscopy in biology

2014 ◽  
Vol 254 (3) ◽  
pp. 109-114 ◽  
Author(s):  
C. KIZILYAPRAK ◽  
J. DARASPE ◽  
B.M. HUMBEL
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Beam Scanning ◽  
Scanning Electron

scholarly journals Correlative In Vivo 2 Photon and Focused Ion Beam Scanning Electron Microscopy of Cortical Neurons

PLoS ONE ◽  
2013 ◽  
Vol 8 (2) ◽  
pp. e57405 ◽  
Author(s):  
Bohumil Maco ◽  
Anthony Holtmaat ◽  
Marco Cantoni ◽  
Anna Kreshuk ◽  
Christoph N. Straehle ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Cortical Neurons ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Beam Scanning ◽  
Scanning Electron

scholarly journals AMST: Alignment to Median Smoothed Template for Focused Ion Beam Scanning Electron Microscopy Image Stacks

2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Julian Hennies ◽  
José Miguel Serra Lleti ◽  
Nicole L. Schieber ◽  
Rachel M. Templin ◽  
Anna M. Steyer ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Scanning Electron Microscopy Image ◽  
Beam Scanning ◽  
Electron Microscopy Image ◽  
Microscopy Image ◽  
Scanning Electron

Degradation profiles in aged EPDM water seals using focused ion beam-scanning electron microscopy

2013 ◽  
Vol 98 (12) ◽  
pp. 2489-2496 ◽  
Author(s):  
Yoshito Ohtake ◽  
Yoshimasa Yamamoto ◽  
Mio Gonokami ◽  
Tsutomu Nakamura ◽  
Hiroyuki Ishii ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Beam Scanning ◽  
Scanning Electron
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