Effect of Operating Conditions on the Degradation Mechanism of Pt3Co Nanocatalysts in PEM Fuel Cells- a Transmission Electron Microscopy Study

Fuel Cells ◽

Degradation Mechanism ◽

Microscopy Study ◽

Pem Fuel Cells ◽

Operating Conditions ◽

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC) ◽

Transmission Electron Microscopy Study on Degradation Mechanism of CdTe Thin-Film Solar Cells

10.1109/pvsc.2018.8548094 ◽

2018 ◽

Author(s):

Jun Liu ◽

Steve Johnston ◽

Steven P. Harvey ◽

David Albin ◽

Peter Hacke ◽

...

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Degradation Mechanism ◽

Microscopy Study ◽

Thin Film Solar Cells ◽

Cdte Thin Film ◽

High-resolution transmission electron microscopy study of defects and interfaces in epitaxial TiO 2 films on sapphire and LaAlO 3

Philosophical Magazine A ◽

10.1080/01418610110087291 ◽

2002 ◽

Vol 82 (4) ◽

pp. 735-749 ◽

Cited By ~ 3

Author(s):

J. Y.Huang ◽

B. H. Park ◽

David Jan ◽

X. Q. Pan ◽

Yuntian T. Zhu ◽

...

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Microscopy Study ◽

A SCANNING AND TRANSMISSION ELECTRON MICROSCOPY STUDY OF POOL BOILING SURFACES

10.1615/ihtc4.140 ◽

1970 ◽

Cited By ~ 2

Author(s):

G. H. Nix ◽

R.I. Vachon ◽

D. M. Hall

Keyword(s):

Electron Microscopy ◽

Pool Boiling ◽

Microscopy Study ◽

Transmission electron microscopy study of a precipitate which forms in the Al-Mg-Si system

Philosophical Magazine Letters ◽

10.1080/095008396180407 ◽

1996 ◽

Vol 74 (2) ◽

pp. 57-66 ◽

Cited By ~ 34

Author(s):

L. Sagalowicz ◽

G. Lapasset ◽

G. Hug

Keyword(s):

Electron Microscopy ◽

Microscopy Study ◽

In Situ Scanning Transmission Electron Microscopy Study of MoS2 Formation on Graphene with a Deep-Learning Framework

ACS Omega ◽

10.1021/acsomega.1c03002 ◽

2021 ◽

Author(s):

Yeongdong Lee ◽

Jongyeong Lee ◽

Handolsam Chung ◽

Jaemin Kim ◽

Zonghoon Lee

Keyword(s):

Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Microscopy Study ◽

Learning Framework ◽

Transmission Electron ◽

Scanning Transmission

In Situ Transmission Electron Microscopy Study on the Deformation Responses of Additively Manufactured Multiphase Ni-based Superalloy

Microscopy and Microanalysis ◽

10.1017/s1431927620019571 ◽

2020 ◽

Vol 26 (S2) ◽

pp. 1844-1846

Author(s):

Qianying Guo ◽

Michael M. Kirka ◽

Kinga A. Unocic

Keyword(s):

Electron Microscopy ◽

Microscopy Study ◽

1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings ◽

An in-situ and ex-situ transmission electron microscopy study of the substrate orientational dependence of the solid-phase epitaxial growth of amorphized GaAs

10.1109/commad.1996.610160 ◽

2002 ◽

Author(s):

K.B. Belay ◽

M.C. Ridgway ◽

D.J. Llewellyn

Keyword(s):

Electron Microscopy ◽

Epitaxial Growth ◽

Solid Phase ◽

Microscopy Study ◽

Ex Situ ◽

A scanning electron microscopy/transmission electron microscopy study of the photocrystallization of amorphous silicon

Journal of Applied Physics ◽

10.1063/1.331800 ◽

1983 ◽

Vol 54 (10) ◽

pp. 5760-5763 ◽

Cited By ~ 5

Author(s):

A. Prasad ◽

K. Ebihara ◽

P. K. John ◽

B. Y. Tong ◽

S. K. Wong ◽

...

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Amorphous Silicon ◽

Microscopy Study ◽

Transmission Electron ◽

Scanning Electron

A transmission electron microscopy study of lattice defects in Mn3O4 hausmannite

Philosophical Magazine B ◽

10.1080/01418639408240274 ◽

1994 ◽

Vol 70 (5) ◽

pp. 1077-1094 ◽

Cited By ~ 13

Author(s):

J. J. Couderc ◽

S. Fritsch ◽

M. Brieu ◽

G. Vanderschaeve ◽

M. Fagot ◽

...

Keyword(s):

Electron Microscopy ◽

Microscopy Study ◽

Lattice Defects ◽

High‐resolution transmission electron microscopy study of solid phase crystallized silicon thin films on SiO2: Crystal growth and defects formation

Journal of Applied Physics ◽

10.1063/1.359359 ◽

1995 ◽

Vol 77 (1) ◽

pp. 95-102 ◽

Cited By ~ 29

Author(s):

J. H. Kim ◽

J. Y. Lee ◽

K. S. Nam

Keyword(s):

Electron Microscopy ◽

Thin Films ◽

Crystal Growth ◽

Solid Phase ◽

Microscopy Study ◽

Silicon Thin Films ◽