scholarly journals Automated Atom-By-Atom Three-Dimensional (3D) Reconstruction of Field Ion Microscopy Data

2017 ◽  
Vol 23 (2) ◽  
pp. 255-268 ◽  
Author(s):  
Michal Dagan ◽  
Baptiste Gault ◽  
George D. W. Smith ◽  
Paul A. J. Bagot ◽  
Michael P. Moody
Keyword(s):  
Three Dimensional ◽  
Reconstruction Algorithm ◽  
Automated Analysis ◽  
Atom Probe ◽  
Crystal Defects ◽  
Steel Matrix ◽  
Field Evaporation ◽  
Field Ion Microscopy ◽  
Ion Microscopy ◽  
Microscopy Data

AbstractAn automated procedure has been developed for the reconstruction of field ion microscopy (FIM) data that maintains its atomistic nature. FIM characterizes individual atoms on the specimen’s surface, evolving subject to field evaporation, in a series of two-dimensional (2D) images. Its unique spatial resolution enables direct imaging of crystal defects as small as single vacancies. To fully exploit FIM’s potential, automated analysis tools are required. The reconstruction algorithm developed here relies on minimal assumptions and is sensitive to atomic coordinates of all imaged atoms. It tracks the atoms across a sequence of images, allocating each to its respective crystallographic plane. The result is a highly accurate 3D lattice-resolved reconstruction. The procedure is applied to over 2000 tungsten atoms, including ion-implanted planes. The approach is further adapted to analyze carbides in a steel matrix, demonstrating its applicability to a range of materials. A vast amount of information is collected during the experiment that can underpin advanced analyses such as automated detection of “out of sequence” events, subangstrom surface displacements and defects effects on neighboring atoms. These analyses have the potential to reveal new insights into the field evaporation process and contribute to improving accuracy and scope of 3D FIM and atom probe characterization.

True Atomic-Scale Imaging in Three Dimensions: A Review of the Rebirth of Field-Ion Microscopy

2017 ◽  
Vol 23 (2) ◽  
pp. 210-220 ◽  
Author(s):  
Francois Vurpillot ◽  
Frédéric Danoix ◽  
Matthieu Gilbert ◽  
Sebastian Koelling ◽  
Michal Dagan ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Atom Probe ◽  
Image Sequences ◽  
Atomic Scale ◽  
Three Dimensions ◽  
Physical Metallurgy ◽  
Science And Engineering ◽  
Computing Power ◽  
Field Ion Microscopy ◽  
Ion Microscopy

AbstractThis article reviews recent advances utilizing field-ion microscopy (FIM) to extract atomic-scale three-dimensional images of materials. This capability is not new, as the first atomic-scale reconstructions of features utilizing FIM were demonstrated decades ago. The rise of atom probe tomography, and the application of this latter technique in place of FIM has unfortunately severely limited further FIM development. Currently, the ubiquitous availability of extensive computing power makes it possible to treat and reconstruct FIM data digitally and this development allows the image sequences obtained utilizing FIM to be extremely valuable for many material science and engineering applications. This article demonstrates different applications of these capabilities, focusing on its use in physical metallurgy and semiconductor science and technology.

Three-dimensional atom probe field-ion microscopy observation of Cu/Co multilayer film structures

1998 ◽  
Vol 73 (8) ◽  
pp. 1125-1127 ◽  
Author(s):  
D. J. Larson ◽  
A. K. Petford-Long ◽  
A. Cerezo ◽  
G. D. W. Smith ◽  
D. T. Foord ◽  
...  
Keyword(s):  
Multilayer Film ◽  
Three Dimensional ◽  
Atom Probe ◽  
Microscopy Observation ◽  
Probe Field ◽  
Field Ion Microscopy ◽  
Ion Microscopy

Analytical Three-Dimensional Field Ion Microscopy of an Amorphous Glass FeBSi

2021 ◽  
pp. 1-9
Author(s):  
Benjamin Klaes ◽  
Jeoffrey Renaux ◽  
Rodrigue Lardé ◽  
Fabien Delaroche ◽  
Felipe F. Morgado ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Atom Probe ◽  
Annealed Sample ◽  
Atomic Scale ◽  
Crystalline Materials ◽  
Field Ion Microscopy ◽  
Amorphous Glass ◽  
Ion Microscopy ◽  
The Moment ◽  
Microscopy Techniques

Three-dimensional field ion microscopy is a powerful technique to analyze material at a truly atomic scale. Most previous studies have been made on pure, crystalline materials such as tungsten or iron. In this article, we study more complex materials, and we present the first images of an amorphous sample, showing the capability to visualize the compositional fluctuations compatible with theoretical medium order in a metallic glass (FeBSi), which is extremely challenging to observe directly using other microscopy techniques. The intensity of the spots of the atoms at the moment of field evaporation in a field ion micrograph can be used as a proxy for identifying the elemental identity of the imaged atoms. By exploiting the elemental identification and positioning information from field ion images, we show the capability of this technique to provide imaging of recrystallized phases in the annealed sample with a superior spatial resolution compared with atom probe tomography.

On the Shape of Field-Ion Emitters

1976 ◽  
Vol 34 ◽  
pp. 520-521
Author(s):  
H.C. Eaton ◽  
B.N. Ranganathan ◽  
T.W. Burwinkle ◽  
R. J. Bayuzick ◽  
J.J. Hren
Keyword(s):  
Grain Boundary ◽  
Spherical Shape ◽  
Theoretical Strength ◽  
Evaporation Process ◽  
Field Evaporation ◽  
Geometric Information ◽  
Field Ion Microscopy ◽  
Considerable Error ◽  
True Shape ◽  
Ion Microscopy

The shape of the emitter is of cardinal importance to field-ion microscopy. First, the field evaporation process itself is closely related to the initial tip shape. Secondly, the imaging stress, which is near the theoretical strength of the material and intrinsic to the imaging process, cannot be characterized without knowledge of the emitter shape. Finally, the problem of obtaining quantitative geometric information from the micrograph cannot be solved without knowing the shape. Previously published grain-boundary topographies were obtained employing an assumption of a spherical shape (1). The present investigation shows that the true shape deviates as much as 100 Å from sphericity and boundary reconstructions contain considerable error as a result.Our present procedures for obtaining tip shape may be summarized as follows. An empirical projection, D=f(θ), is obtained by digitizing the positions of poles on a field-ion micrograph.

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