Analytical Three-Dimensional Field Ion Microscopy of an Amorphous Glass FeBSi

Three-dimensional field ion microscopy is a powerful technique to analyze material at a truly atomic scale. Most previous studies have been made on pure, crystalline materials such as tungsten or iron. In this article, we study more complex materials, and we present the first images of an amorphous sample, showing the capability to visualize the compositional fluctuations compatible with theoretical medium order in a metallic glass (FeBSi), which is extremely challenging to observe directly using other microscopy techniques. The intensity of the spots of the atoms at the moment of field evaporation in a field ion micrograph can be used as a proxy for identifying the elemental identity of the imaged atoms. By exploiting the elemental identification and positioning information from field ion images, we show the capability of this technique to provide imaging of recrystallized phases in the annealed sample with a superior spatial resolution compared with atom probe tomography.

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True Atomic-Scale Imaging in Three Dimensions: A Review of the Rebirth of Field-Ion Microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927617000198 ◽

2017 ◽

Vol 23 (2) ◽

pp. 210-220 ◽

Cited By ~ 6

Author(s):

Francois Vurpillot ◽

Frédéric Danoix ◽

Matthieu Gilbert ◽

Sebastian Koelling ◽

Michal Dagan ◽

...

Keyword(s):

Three Dimensional ◽

Atom Probe ◽

Image Sequences ◽

Atomic Scale ◽

Three Dimensions ◽

Physical Metallurgy ◽

Science And Engineering ◽

Computing Power ◽

Field Ion Microscopy ◽

Ion Microscopy

AbstractThis article reviews recent advances utilizing field-ion microscopy (FIM) to extract atomic-scale three-dimensional images of materials. This capability is not new, as the first atomic-scale reconstructions of features utilizing FIM were demonstrated decades ago. The rise of atom probe tomography, and the application of this latter technique in place of FIM has unfortunately severely limited further FIM development. Currently, the ubiquitous availability of extensive computing power makes it possible to treat and reconstruct FIM data digitally and this development allows the image sequences obtained utilizing FIM to be extremely valuable for many material science and engineering applications. This article demonstrates different applications of these capabilities, focusing on its use in physical metallurgy and semiconductor science and technology.

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Investigation of boron-enriched Cottrell atmospheres in FeAl on an atomic scale by three-dimensional atom-probe field-ion microscopy

Philosophical Magazine Letters ◽

10.1080/09500830050192945 ◽

2000 ◽

Vol 80 (11) ◽

pp. 725-736 ◽

Cited By ~ 10

Author(s):

Emmanuel Cadel ◽

Sebastien Launois ◽

Anna Fraczkiewicz ◽

Didier Blavette

Keyword(s):

Three Dimensional ◽

Atom Probe ◽

Atomic Scale ◽

Probe Field ◽

Field Ion Microscopy ◽

Ion Microscopy ◽

Cottrell Atmospheres

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Nanometer Scale Tomographic Investigation of Fine Scale Precipitates in a CuFeNi Granular System by Three-Dimensional Field Ion Microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927612000517 ◽

2012 ◽

Vol 18 (5) ◽

pp. 1129-1134 ◽

Cited By ~ 3

Author(s):

Sophie Cazottes ◽

François Vurpillot ◽

Abdeslem Fnidiki ◽

Dany Lemarchand ◽

Marcello Baricco ◽

...

Keyword(s):

Three Dimensional ◽

Precise Determination ◽

Atomic Scale ◽

Granular System ◽

Field Ion Microscopy ◽

Mean Diameter ◽

The Matrix ◽

The Mean ◽

Ion Microscopy

AbstractThe microstructure of Cu80Fe10Ni10 (at. %) granular ribbons was investigated by means of three-dimensional field ion microscopy (3D FIM). This ribbon is composed of magnetic precipitates embedded in a nonmagnetic matrix. The magnetic precipitates have a diameter smaller than 5 nm in the as-spun state and are coherent with the matrix. No accurate characterization of such a microstructure has been performed so far. A tomographic characterization of the microstructure of melt spun and annealed Cu80Fe10Ni10 ribbon was achieved with 3D FIM at the atomic scale. A precise determination of the size distribution, number density, and distance between the precipitates was carried out. The mean diameter for the precipitates is 4 nm in the as-spun state. After 2 h at 350°C, there is an increase of the size of the precipitates, while after 2 h at 400°C the mean diameter of the precipitates decreases. Those data were used as inputs in models that describe the magnetic and magnetoresistive properties of this alloy.

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Automated Atom-By-Atom Three-Dimensional (3D) Reconstruction of Field Ion Microscopy Data

Microscopy and Microanalysis ◽

10.1017/s1431927617000277 ◽

2017 ◽

Vol 23 (2) ◽

pp. 255-268 ◽

Cited By ~ 7

Author(s):

Michal Dagan ◽

Baptiste Gault ◽

George D. W. Smith ◽

Paul A. J. Bagot ◽

Michael P. Moody

Keyword(s):

Three Dimensional ◽

Reconstruction Algorithm ◽

Automated Analysis ◽

Atom Probe ◽

Crystal Defects ◽

Steel Matrix ◽

Field Evaporation ◽

Field Ion Microscopy ◽

Ion Microscopy ◽

Microscopy Data

AbstractAn automated procedure has been developed for the reconstruction of field ion microscopy (FIM) data that maintains its atomistic nature. FIM characterizes individual atoms on the specimen’s surface, evolving subject to field evaporation, in a series of two-dimensional (2D) images. Its unique spatial resolution enables direct imaging of crystal defects as small as single vacancies. To fully exploit FIM’s potential, automated analysis tools are required. The reconstruction algorithm developed here relies on minimal assumptions and is sensitive to atomic coordinates of all imaged atoms. It tracks the atoms across a sequence of images, allocating each to its respective crystallographic plane. The result is a highly accurate 3D lattice-resolved reconstruction. The procedure is applied to over 2000 tungsten atoms, including ion-implanted planes. The approach is further adapted to analyze carbides in a steel matrix, demonstrating its applicability to a range of materials. A vast amount of information is collected during the experiment that can underpin advanced analyses such as automated detection of “out of sequence” events, subangstrom surface displacements and defects effects on neighboring atoms. These analyses have the potential to reveal new insights into the field evaporation process and contribute to improving accuracy and scope of 3D FIM and atom probe characterization.

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Atom Probe Field Ion Microscopy and High Resolution Electron Microscopy: two complementary methods for atomic scale characterisation

2006 19th International Vacuum Nanoelectronics Conference ◽

10.1109/ivnc.2006.335304 ◽

2006 ◽

Author(s):

F. Danoix ◽

T. Gloriant ◽

T. Epicier ◽

F. Vurpillot ◽

W. Lefebvre

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

High Resolution Electron Microscopy ◽

Atom Probe ◽

Atomic Scale ◽

Probe Field ◽

Field Ion Microscopy ◽

Complementary Methods ◽

Resolution Electron ◽

Ion Microscopy

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On the Physics of Anomalies of Boron Nanosegregation at Dislocations in FeAl

Defect and Diffusion Forum ◽

10.4028/www.scientific.net/ddf.391.246 ◽

2019 ◽

Vol 391 ◽

pp. 246-250

Author(s):

Yuriy S. Nechaev ◽

Andreas Öchsner

Keyword(s):

Mechanical Properties ◽

Critical Analysis ◽

Diffusion Processes ◽

Three Dimensional ◽

Atom Probe ◽

Atomic Scale ◽

Metallic Materials ◽

Probe Field ◽

Ion Microscopy ◽

And Diffusion

We present results of the constructive critical analysis and interpretation of some recent studies (Blavette, Sauvage, Wilde and others) at the atomic scale (using three-dimensional atom-probe field-ion microscopy) of impurity nanosegregation at dislocations, including “Cottrell atmospheres”, and grain boundaries in deformed intermetallics and metallic materials, and their relevance to mechanical properties and diffusion processes.

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