To obtain further progress and a more detailed understanding of the mechanisms involved in recrystallisation, new and more accurate techniques such as in-situ observations are necessary. This innovative method has been used to monitor the recrystallisation process in a FEGSEM equipped with hot stage. Observations are done in backscatter mode with particular attention to orientation contrast. EBSD maps of the observed areas can be acquired before and after recrystallisation. Details of the movement of the interfaces between the recrystallised region and the parent structure are recorded and analysed. The results show that the grain boundaries observed do not move smoothly but with a jerky motion. The recrystallising front sweeps through small areas, corresponding to single sub-grains or small groups of them, very rapidly and then stops at other sub-grain boundaries for varying time before progressing to the following area.
In Situ Visualization of Optoelectronic Behavior of Grain Boundaries in Monolayer WSe2 at the Nanoscale
