Probing Dopant Locations in Silicon Nanocrystals via High Energy X-ray Diffraction and Reverse Monte Carlo Simulation
2017 ◽
Vol 459
◽
pp. 99-102
◽
2009 ◽
Vol 311
(3)
◽
pp. 966-969
◽
2010 ◽
Vol 51
(10)
◽
pp. 1796-1801
◽
2005 ◽
Vol 47
(5)
◽
pp. 1271-1284
◽
1999 ◽
Vol 40
(6)
◽
pp. 552-555
◽
2016 ◽
Vol 145
(9)
◽
pp. 094503
◽
Keyword(s):