Introducing a Surface-Enhanced-Raman-Scattering Enhancer for Experimental Estimation of the Debye Screening Length in Organic Field-Effect Transistors
2012 ◽
Vol 116
(23)
◽
pp. 12779-12785
◽
2012 ◽
Keyword(s):
2006 ◽
Vol 46
(3)
◽
pp. 299-305
◽
2006 ◽
Vol 46
(3)
◽
pp. 307-315
◽