Measuring the Thickness and Potential Profiles of the Space-Charge Layer at Organic/Organic Interfaces under Illumination and in the Dark by Scanning Kelvin Probe Microscopy
2016 ◽
Vol 8
(9)
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pp. 5772-5776
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2013 ◽
Vol 13
(12)
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pp. 8217-8223
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Keyword(s):
2018 ◽
Vol 1124
◽
pp. 081028
Keyword(s):
Keyword(s):