Dielectric Characterization of Water in Polyimide and Poly(amide—imide) Thin Films

1989 ◽  
pp. 67-76
Author(s):  
Allyson J. Beuhler ◽  
Neal R. Nowicki ◽  
Joanne M. Gaudette
Keyword(s):  
Thin Films ◽  
Dielectric Characterization

scholarly journals Deposition and dielectric characterization of strontium and tantalum-based oxide and oxynitride perovskite thin films

2016 ◽  
Vol 54 ◽  
pp. 22-29 ◽  
Author(s):  
S. Jacq ◽  
C. Le Paven ◽  
L. Le Gendre ◽  
R. Benzerga ◽  
F. Cheviré ◽  
...  
Keyword(s):  
Thin Films ◽  
Dielectric Characterization

Dielectric characterization of Bi3.25La0.75Ti3O12 thin films

2004 ◽  
Vol 84 (22) ◽  
pp. 4505-4507 ◽  
Author(s):  
Di Wu ◽  
Aidong Li ◽  
Naiben Ming
Keyword(s):  
Thin Films ◽  
Dielectric Characterization

Dielectric characterization of ferroelectric thin films deposited on silicon

1999 ◽  
Vol 39 (2) ◽  
pp. 251-256 ◽  
Author(s):  
C. Legrand ◽  
T. Haccart ◽  
G. Velu ◽  
D. Chambonnet ◽  
D. Remiens ◽  
...  
Keyword(s):  
Thin Films ◽  
Ferroelectric Thin Films ◽  
Dielectric Characterization

Dielectric Characterization of Thin Films Consisting of Tin Doped Indium Oxide Nanoparticles

1999 ◽  
Vol 581 ◽  
Author(s):  
A. Hultåker ◽  
G. A. Niklasson
Keyword(s):  
Thin Films ◽  
Indium Oxide ◽  
Grazing Incidence ◽  
Sintering Behavior ◽  
Nanoparticle Dispersion ◽  
X Ray Diffraction ◽  
Dielectric Characterization ◽  
Transparent Conducting ◽  
Production Techniques

ABSTRACTIn recent years there has been a growing interest in cheap and easy production techniques for transparent conducting thin films. One way of making these uses a nanoparticle dispersion. We prepared thin films of tin doped indium oxide by spin-coating of a solution of nanoparticles. The sintering behavior of these ceramic particles was studied by dielectric spectroscopy and by grazing incidence X-ray diffraction. The grain growth was found to start at 1000°C and to be prominent at 1250°C. However, the electrical conductivity reached a maximum below these temperatures.

Low temperature dielectric characterization of Mg-doped SrTiO3 thin films prepared by sol-gel

2010 ◽  
Vol 96 (15) ◽  
pp. 152906 ◽  
Author(s):  
Olena Okhay ◽  
Aiying Wu ◽  
Paula M. Vilarinho ◽  
Alexander Tkach
Keyword(s):  
Thin Films ◽  
Low Temperature ◽  
Sol Gel ◽  
Dielectric Characterization ◽  
Mg Doped

Electrical conduction mechanism and dielectric characterization of MnTPPCl thin films

2018 ◽  
Vol 539 ◽  
pp. 1-7 ◽  
Author(s):  
M.S. Meikhail ◽  
A.H. Oraby ◽  
M.M. El-Nahass ◽  
H.M. Zeyada ◽  
A.A. Al-Muntaser
Keyword(s):  
Thin Films ◽  
Electrical Conduction ◽  
Conduction Mechanism ◽  
Dielectric Characterization ◽  
Electrical Conduction Mechanism

Processing and dielectric characterization of Ba0.3Sr0.7TiO3 thin films on alumina substrates

2007 ◽  
Vol 27 (8-9) ◽  
pp. 2945-2948 ◽  
Author(s):  
Barbara Malic ◽  
Iulian Boerasu ◽  
Mira Mandeljc ◽  
Marija Kosec ◽  
Vladimir Sherman ◽  
...  
Keyword(s):  
Thin Films ◽  
Dielectric Characterization
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