Characterization of Free-Volume Properties of Surface and Interfaces in Thin Film Using Positron Annihilation Spectroscopy
2006 ◽
pp. 91-104
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1999 ◽
Vol 12
(5)
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pp. 739-742
2003 ◽
Vol 90
(6)
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pp. 1507-1514
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2002 ◽
Vol 17
(5)
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pp. 1153-1161
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2008 ◽
Vol 17
(2)
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pp. 160-164
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Keyword(s):
1992 ◽
Vol 105-110
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pp. 309-316
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Keyword(s):
2013 ◽
Vol 22
(5)
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pp. 250-256
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Keyword(s):