Characterization of Ultra-Thin Hafnium Oxide Films Grown on Silicon by Atomic Layer Deposition Using Tetrakis(ethylmethyl-amino) Hafnium and Water Precursors
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2004 ◽
Vol 22
(5)
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pp. 2035-2040
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2007 ◽
Vol 47
(4-5)
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pp. 825-829
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2001 ◽
Vol 16
(1-2)
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pp. 59-64
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