Characterization of Ultra-Thin Hafnium Oxide Films Grown on Silicon by Atomic Layer Deposition Using Tetrakis(ethylmethyl-amino) Hafnium and Water Precursors

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pp. 3127-3138 ◽  
Author(s):  
Y. Wang ◽  
M.-T. Ho ◽  
L. V. Goncharova ◽  
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Author(s):  
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2004 ◽  
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2007 ◽  
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S. Taylor ◽  
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Vol 93 (1) ◽  
pp. 712-718 ◽  
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W. Zhuang ◽  
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