Scanning Transmission Electron Microscopy Investigation of Differences in the High Temperature Redox Deactivation Behavior of CePrOxParticles Supported on Modified Alumina

Chemistry of Materials ◽

10.1021/cm8029054 ◽

2009 ◽

Vol 21 (6) ◽

pp. 1035-1045 ◽

Author(s):

Miguel López-Haro ◽

Karima Aboussaïd ◽

Juan C. Gonzalez ◽

Juan C. Hernández ◽

José M. Pintado ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Temperature ◽

Scanning Transmission Electron Microscopy ◽

Transmission Electron Microscopy Investigation ◽

Modified Alumina ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation ◽

Scanning Transmission

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Scanning Transmission Electron Microscopy Investigation of the Structure of Multilayered Perpendicular Magnetic Tunnel Junctions

Microscopy and Microanalysis ◽

10.1017/s1431927615004882 ◽

2015 ◽

Vol 21 (S3) ◽

pp. 817-818

Author(s):

Danielle Reifsnyder Hickey ◽

K. Andre Mkhoyan

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Tunnel Junctions ◽

Transmission Electron Microscopy Investigation ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation ◽

Scanning Transmission

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Scanning transmission electron microscopy investigation of an Al–Mg–Si–Ge–Cu alloy

The Philosophical Magazine A Journal of Theoretical Experimental and Applied Physics ◽

10.1080/14786435.2012.700129 ◽

2012 ◽

Vol 92 (32) ◽

pp. 3983-3993 ◽

Author(s):

R. Bjørge ◽

S.J. Andersen ◽

C.D. Marioara ◽

J. Etheridge ◽

R. Holmestad

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Transmission Electron Microscopy Investigation ◽

Scanning Transmission Electron ◽

Cu Alloy ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation ◽

Scanning Transmission

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Scanning transmission electron microscopy investigation of the Si(111)/AlN interface grown by metalorganic vapor phase epitaxy

Applied Physics Letters ◽

10.1063/1.3527928 ◽

2010 ◽

Vol 97 (25) ◽

pp. 251901 ◽

Author(s):

G. Radtke ◽

M. Couillard ◽

G. A. Botton ◽

D. Zhu ◽

C. J. Humphreys

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Vapor Phase ◽

Scanning Transmission Electron Microscopy ◽

Metalorganic Vapor Phase Epitaxy ◽

Transmission Electron Microscopy Investigation ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation ◽

Scanning Transmission

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A Scanning Transmission Electron Microscopy Investigation of Grain-Boundary Segregation in a ZnO-Bi2O3Varistor

Journal of the American Ceramic Society ◽

10.1111/j.1151-2916.1979.tb19064.x ◽

1979 ◽

Vol 62 (3-4) ◽

pp. 221-222 ◽

Author(s):

W. D. KINGERY ◽

J. B. SANDE ◽

TAKASHI MITAMURA

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Boundary Segregation ◽

Grain Boundary Segregation ◽

Transmission Electron Microscopy Investigation ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation ◽

Scanning Transmission

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Transmission/scanning transmission electron microscopy investigation of Au/Cr contacts to p-type InP

Solid-State Electronics ◽

10.1016/0038-1101(88)90423-6 ◽

1988 ◽

Vol 31 (8) ◽

pp. 1251-1258 ◽

Author(s):

D.G. Ivey ◽

R. Bruce ◽

G.R. Piercy

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Transmission Electron Microscopy Investigation ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation ◽

Scanning Transmission ◽

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Scanning Transmission Electron Microscopy Investigation of LaAlO3/SrTiO3 Bi-Interfaces

European Microscopy Congress 2016: Proceedings ◽

10.1002/9783527808465.emc2016.4550 ◽

2016 ◽

pp. 992-993

Author(s):

Giulio Tieri ◽

Alexandre Gloter ◽

Danfeng Li ◽

Stefano Gariglio ◽

Jean-Marc Triscone ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Transmission Electron Microscopy Investigation ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation ◽

Scanning Transmission

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In-situ transmission electron microscopy investigation of TiO islands nucleating on SrTiO3 (100) and (110) surfaces at high temperature

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85156-1_236 ◽

2008 ◽

pp. 471-472

Author(s):

P. J. Bellina ◽

F. Phillipp ◽

P. A. van Aken

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Temperature ◽

Transmission Electron Microscopy Investigation ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation

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Transmission electron microscopy investigation of the high temperature BiScO3−PbTiO3 piezoelectric ceramic system

Journal of Applied Physics ◽

10.1063/1.1573340 ◽

2003 ◽

Vol 93 (11) ◽

pp. 9271-9274 ◽

Author(s):

C. A. Randall ◽

R. E. Eitel ◽

T. R. Shrout ◽

D. I. Woodward ◽

I. M. Reaney

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Temperature ◽

Piezoelectric Ceramic ◽

Transmission Electron Microscopy Investigation ◽

Ceramic System ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation

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High temperature deformation of diopside single crystal. 2. Transmission electron microscopy investigation of the defect microstructures

International Journal of Rock Mechanics and Mining Sciences & Geomechanics Abstracts ◽

10.1016/0148-9062(92)93774-e ◽

1992 ◽

Vol 29 (3) ◽

pp. A153

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Temperature ◽

High Temperature Deformation ◽

Temperature Deformation ◽

Transmission Electron Microscopy Investigation ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation ◽

Defect Microstructures

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High-temperature deformation of diopside single crystal: 2. Transmission electron microscopy investigation of the defect microstructures

Journal of Geophysical Research Atmospheres ◽

10.1029/91jb01233 ◽

1991 ◽

Vol 96 (B9) ◽

pp. 14287-14297 ◽

Author(s):

J. Ingrin ◽

N. Doukhan ◽

J. C. Doukhan

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Temperature ◽

High Temperature Deformation ◽

Temperature Deformation ◽

Transmission Electron Microscopy Investigation ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation ◽

Defect Microstructures

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