Scanning transmission electron microscopy investigation of the Si(111)/AlN interface grown by metalorganic vapor phase epitaxy

2010 ◽  
Vol 97 (25) ◽  
pp. 251901 ◽  
Author(s):  
G. Radtke ◽  
M. Couillard ◽  
G. A. Botton ◽  
D. Zhu ◽  
C. J. Humphreys
Sign in / Sign up

Export Citation Format

Share Document