Investigations of zeolites by photoelectron and ion scattering spectroscopy. 1. New applications of surface spectroscopic methods to zeolites by a high-temperature measurement technique

1993 ◽  
Vol 97 (33) ◽  
pp. 8638-8645 ◽  
Author(s):  
Wolfgang Gruenert ◽  
Robert Schloegl ◽  
Hellmut G. Karge
Keyword(s):  
High Temperature ◽  
Temperature Measurement ◽  
Measurement Technique ◽  
Spectroscopic Methods ◽  
Ion Scattering ◽  
High Temperature Measurement ◽  
Ion Scattering Spectroscopy ◽  
New Applications ◽  
Temperature Measurement Technique

Temperature measurement technique for high-temperature gases using a tunable diode laser

1978 ◽  
Vol 17 (16) ◽  
pp. 2477 ◽  
Author(s):  
Ronald K. Hanson ◽  
Patricia Kuntz Falcone
Keyword(s):  
High Temperature ◽  
Temperature Measurement ◽  
Diode Laser ◽  
Measurement Technique ◽  
Tunable Diode Laser ◽  
Temperature Measurement Technique

Study on characteristics of schottky temperature detector based on metal/n-ZnO/n-Si structures

2020 ◽  
Vol 12 ◽  
Author(s):  
Fang Wang ◽  
Jingkai Wei ◽  
Caixia Guo ◽  
Tao Ma ◽  
Linqing Zhang ◽  
...  
Keyword(s):  
High Temperature ◽  
Temperature Measurement ◽  
Temperature Response ◽  
Large Temperature ◽  
Mems Devices ◽  
Temperature Range ◽  
Response Characteristics ◽  
High Temperature Measurement ◽  
Temperature Detector ◽  
Schottky Structure

Background: At present, the main problems of Micro-Electro-Mechanical Systems (MEMS) temperature detector focus on the narrow range of temperature detection, difficulty of the high temperature measurement. Besides, MEMS devices have different response characteristics for various surrounding temperature in the petrochemical and metallurgy application fields with high-temperature and harsh conditions. To evaluate the performance stability of the hightemperature MEMS devices, the real-time temperature measurement is necessary. Objective: A schottky temperature detector based on the metal/n-ZnO/n-Si structures is designed to measure high temperature (523~873K) for the high-temperature MEMS devices with large temperature range. Method: By using the finite element method (FEM), three different work function metals (Cu, Ni and Pt) contact with the n-ZnO are investigated to realize Schottky. At room temperature (298K) and high temperature (523~873K), the current densities with various bias voltages (J-V) are studied. Results: The simulation results show that the high temperature response power consumption of three schottky detectors of Cu, Ni and Pt decreases successively, which are 1.16 mW, 63.63 μW and 0.14 μW. The response temperature sensitivities of 6.35 μA/K, 0.78 μA/K, and 2.29 nA/K are achieved. Conclusion: The Cu/n-ZnO/n-Si schottky structure could be used as a high temperature detector (523~873K) for the hightemperature MEMS devices. It has a large temperature range (350K) and a high response sensitivity is 6.35 μA/K. Compared with traditional devices, the Cu/n-ZnO/n-Si Schottky structure based temperature detector has a low energy consumption of 1.16 mW, which has potential applications in the high-temperature measurement of the MEMS devices.

scholarly journals Development of Local Gas Temperature Measurement Technique inside a Combustion Chamber Using Two-Wire Thermocouple

2008 ◽  
Vol 3 (3) ◽  
pp. 486-498 ◽  
Author(s):  
Shigemi KOBAYASHI ◽  
Yasuo MORIYOSHI ◽  
Yoshiteru ENOMOTO
Keyword(s):  
Combustion Chamber ◽  
Temperature Measurement ◽  
Measurement Technique ◽  
Gas Temperature ◽  
Temperature Measurement Technique

scholarly journals High Temperature Measurement of the Effective Diffusivity of Gas through Coke and Graphite by the WICKE-KALLENBACH Method

1987 ◽  
Vol 73 (3) ◽  
pp. 453-460 ◽  
Author(s):  
Yoshihito SHIGENO ◽  
Saburo KOBAYASHI ◽  
Yasuo OMORI
Keyword(s):  
High Temperature ◽  
Temperature Measurement ◽  
Effective Diffusivity ◽  
High Temperature Measurement

scholarly journals Innovations in High Temperature Measurement

2012 ◽  
Vol 45 (5) ◽  
pp. 141-144 ◽  
Author(s):  
Machin Graham
Keyword(s):  
High Temperature ◽  
Temperature Measurement ◽  
High Temperature Measurement

scholarly journals Miniaturized fiber taper reflective interferometer for high temperature measurement

2010 ◽  
Vol 18 (13) ◽  
pp. 14245 ◽  
Author(s):  
Jun-long Kou ◽  
Jing Feng ◽  
Liang Ye ◽  
Fei Xu ◽  
Yan-qing Lu
Keyword(s):  
High Temperature ◽  
Temperature Measurement ◽  
High Temperature Measurement ◽  
Fiber Taper
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