Surface recombination velocity measurements of cadmium sulfide single crystals immersed in electrolytes. A picosecond photoluminescence study

The Journal of Physical Chemistry ◽

10.1021/j100327a024 ◽

1988 ◽

Vol 92 (16) ◽

pp. 4676-4679 ◽

Author(s):

D. Benjamin ◽

D. Huppert

Keyword(s):

Cadmium Sulfide ◽

Single Crystals ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Velocity Measurements ◽

Photoluminescence Study ◽

Recombination Velocity

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ChemInform Abstract: Surface Recombination Velocity (SRV) Measurements of CdS Single Crystals Immersed in Electrolytes. A Picosecond Photoluminescence Study.

10.1002/chin.198844033 ◽

1988 ◽

Vol 19 (44) ◽

Author(s):

D. BENJAMIN ◽

D. HUPPERT

Keyword(s):

Single Crystals ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Photoluminescence Study ◽

Recombination Velocity

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Lifetime and effective surface recombination velocity measurements in high-efficiency Si solar cells

10.1109/iedm.1981.190023 ◽

1981 ◽

Author(s):

B.H. Rose

Keyword(s):

Solar Cells ◽

High Efficiency ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Velocity Measurements ◽

Effective Surface ◽

Si Solar Cells ◽

Recombination Velocity

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Theory of diffusion constant-, lifetime- and surface recombination velocity-measurements with the scanning electron microscope

Solid-State Electronics ◽

10.1016/0038-1101(78)90294-0 ◽

1978 ◽

Vol 21 (7) ◽

pp. 957-964 ◽

Author(s):

J.D. Kamm ◽

H. Bernt

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Diffusion Constant ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Velocity Measurements ◽

Recombination Velocity ◽

Scanning Electron

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Diffusion length and surface recombination velocity measurements with the scanning electron microscope: The highly-doped emitter of a p-n junction

Solid-State Electronics ◽

10.1016/0038-1101(84)90093-5 ◽

1984 ◽

Vol 27 (1) ◽

pp. 59-67 ◽

Author(s):

D.E. Burk ◽

R. Sundaresan

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Diffusion Length ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Velocity Measurements ◽

Recombination Velocity ◽

Scanning Electron

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Surface Recombination Velocity Measurements of Efficiently Passivated Gold-Catalyzed Silicon Nanowires by a New Optical Method

Nano Letters ◽

10.1021/nl903166t ◽

2010 ◽

Vol 10 (7) ◽

pp. 2323-2329 ◽

Author(s):

O. Demichel ◽

V. Calvo ◽

A. Besson ◽

P. Noé ◽

B. Salem ◽

...

Keyword(s):

Silicon Nanowires ◽

Optical Method ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Velocity Measurements ◽

Recombination Velocity

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Diffusion length and surface recombination velocity measurements with the scanning electron microscope: the highly-doped emitter of a junction

Microelectronics Reliability ◽

10.1016/0026-2714(84)90155-0 ◽

1984 ◽

Vol 24 (5) ◽

pp. 1000

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Diffusion Length ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Velocity Measurements ◽

Recombination Velocity ◽

Scanning Electron

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Studies of surface recombination velocity at copper/cadmium sulfide (1120) interfaces

The Journal of Physical Chemistry ◽

10.1021/j100380a055 ◽

1990 ◽

Vol 94 (17) ◽

pp. 6842-6847 ◽

Author(s):

Y. Rosenwaks ◽

L. Burstein ◽

Yoram. Shapira ◽

D. Huppert

Keyword(s):

Cadmium Sulfide ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Recombination Velocity

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Surface recombination velocity measurements at the silicon–silicon dioxide interface by microwave‐detected photoconductance decay

Journal of Applied Physics ◽

10.1063/1.357082 ◽

1994 ◽

Vol 76 (1) ◽

pp. 363-370 ◽

Author(s):

A. W. Stephens ◽

A. G. Aberle ◽

M. A. Green

Keyword(s):

Silicon Dioxide ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Velocity Measurements ◽

Recombination Velocity ◽

Silicon Silicon ◽

Silicon Silicon Dioxide Interface

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Surface Recombination Velocity Measurements of Metallized Surfaces by Photoluminescence Imaging

Energy Procedia ◽

10.1016/j.egypro.2013.11.084 ◽

2013 ◽

Vol 43 ◽

pp. 18-26 ◽

Author(s):

Frode Kløw ◽

Halvard Haug ◽

Sean Erik Foss

Keyword(s):

Surface Recombination ◽

Surface Recombination Velocity ◽

Velocity Measurements ◽

Recombination Velocity

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Theory of diffusion constant-, lifetime- and surface recombination velocity-measurements with the scanning electron microscope

Microelectronics Reliability ◽

10.1016/0026-2714(78)90545-0 ◽

1978 ◽

Vol 18 (4) ◽

pp. 318

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Diffusion Constant ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Velocity Measurements ◽

Recombination Velocity ◽

Scanning Electron

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