Determination of critical micelle concentrations in micellar and reversed micellar systems by positron annihilation techniques

1978 ◽  
Vol 100 (3) ◽  
pp. 984-985 ◽  
Author(s):  
Yan-Ching Jean ◽  
Hans J. Ache
Keyword(s):  
Positron Annihilation ◽  
Critical Micelle Concentrations ◽  
Micellar Systems

Determination of nanoobject sizes and concentrations in irradiated metals and alloys via positron annihilation spectroscopy

2011 ◽  
Vol 5 (4) ◽  
pp. 636-646 ◽  
Author(s):  
V. I. Grafutin ◽  
E. P. Prokop’ev ◽  
V. Krsjak ◽  
R. Burcl ◽  
P. Häehner ◽  
...  
Keyword(s):  
Positron Annihilation ◽  
Positron Annihilation Spectroscopy ◽  
Metals And Alloys

Novel Fluorescence Spectral Deconvolution Method for Determination of Critical Micelle Concentrations Using the Fluorescence Probe PRODAN

Langmuir ◽  
1999 ◽  
Vol 15 (19) ◽  
pp. 6181-6186 ◽  
Author(s):  
J. E. Wong ◽  
T. M. Duchscherer ◽  
G. Pietraru ◽  
D. T. Cramb
Keyword(s):  
Fluorescence Probe ◽  
Deconvolution Method ◽  
Spectral Deconvolution ◽  
Critical Micelle Concentrations ◽  
Spectral Deconvolution Method

Determination of the quantum density matrix from experiment: An application to positron annihilation

1986 ◽  
Vol 33 (9) ◽  
pp. 5987-5993 ◽  
Author(s):  
L. M. Pecora
Keyword(s):  
Density Matrix ◽  
Positron Annihilation

Difference spectrophotometric method for the determination of critical micelle concentrations

1971 ◽  
Vol 75 (6) ◽  
pp. 804-808 ◽  
Author(s):  
George. Nemethy ◽  
Ashoka. Ray
Keyword(s):  
Spectrophotometric Method ◽  
Critical Micelle Concentrations

Determination of the defect depth profile after saw cutting of GaAs wafers measured by positron annihilation

1998 ◽  
Vol 84 (4) ◽  
pp. 2255-2262 ◽  
Author(s):  
F. Börner ◽  
S. Eichler ◽  
A. Polity ◽  
R. Krause-Rehberg ◽  
R. Hammer ◽  
...  
Keyword(s):  
Positron Annihilation ◽  
Depth Profile ◽  
Defect Depth
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