Determination of the defect depth profile after saw cutting of GaAs wafers measured by positron annihilation

1998 ◽  
Vol 84 (4) ◽  
pp. 2255-2262 ◽  
Author(s):  
F. Börner ◽  
S. Eichler ◽  
A. Polity ◽  
R. Krause-Rehberg ◽  
R. Hammer ◽  
...  





Author(s):  
V. I. Grafutin ◽  
E. P. Prokop’ev ◽  
V. Krsjak ◽  
R. Burcl ◽  
P. Häehner ◽  
...  




2013 ◽  
Vol 117 (17) ◽  
pp. 5002-5008 ◽  
Author(s):  
Alexander Körner ◽  
Wasim Abuillan ◽  
Christina Deichmann ◽  
Fernanda F. Rossetti ◽  
Almut Köhler ◽  
...  






1974 ◽  
Vol 17 (8) ◽  
pp. 1141-1145
Author(s):  
K. P. Aref'ev ◽  
S. A. Vorob'ev ◽  
G. I. Etin




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