Polarization-Modulation Near-Field Scanning Optical Microscopy of Mesostructured Materials

1996 ◽  
Vol 100 (32) ◽  
pp. 13794-13803 ◽  
Author(s):  
Daniel A. Higgins ◽  
David A. Vanden Bout ◽  
Josef Kerimo ◽  
Paul F. Barbara

1997 ◽  
Vol 474 ◽  
Author(s):  
E. B. McDaniel ◽  
J. W. P. Hsu

ABSTRACTWe incorporate a polarization modulation technique in a near-field scanning optical microscope (NSOM) for quantitative polarimetry studies at the nanometer scale. Using this technique, we map out stress-induced birefringence associated with submicron defects at the fusion boundaries of SiTiO3 bicrystals. The strain fields surrounding these defects are larger than the defect sizes and show complex spiral shapes that break the reflection symmetry of the bicrystal boundary.



1995 ◽  
Vol 67 (17) ◽  
pp. 2483-2485 ◽  
Author(s):  
C. L. Jahncke ◽  
M. A. Paesler ◽  
H. D. Hallen


1995 ◽  
Vol 61 (1-4) ◽  
pp. 291-294 ◽  
Author(s):  
Patrick J. Moyer ◽  
Stefan Kämmer ◽  
Karsten Walzer ◽  
Michael Hietschold


2016 ◽  
Vol 49 (17) ◽  
pp. 6439-6444 ◽  
Author(s):  
Shiran Nabha-Barnea ◽  
Nitzan Maman ◽  
Iris Visoly-Fisher ◽  
Rafi Shikler




2004 ◽  
Vol 1 (9) ◽  
pp. 2292-2297 ◽  
Author(s):  
E. E. van Dyk ◽  
A. Karoui ◽  
A. H. La Rosa ◽  
G. Rozgonyi


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