Measurement of Strain Associated with Defects in SiTiO3 Bicrystals using Near-Field Scanning Optical Microscopy
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ABSTRACTWe incorporate a polarization modulation technique in a near-field scanning optical microscope (NSOM) for quantitative polarimetry studies at the nanometer scale. Using this technique, we map out stress-induced birefringence associated with submicron defects at the fusion boundaries of SiTiO3 bicrystals. The strain fields surrounding these defects are larger than the defect sizes and show complex spiral shapes that break the reflection symmetry of the bicrystal boundary.
2004 ◽
1988 ◽
Vol 46
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pp. 436-437
2011 ◽
1996 ◽
Vol 100
(32)
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pp. 13794-13803
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2003 ◽
Vol 02
(04n05)
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pp. 225-230
1986 ◽
Vol 44
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pp. 642-643