In Situ Scanning Tunneling Microscopy of Well-Defined Ir(111) Surface:  High-Resolution Imaging of Adsorbed Sulfate

1999 ◽  
Vol 103 (33) ◽  
pp. 6978-6983 ◽  
Author(s):  
Li-Jun Wan ◽  
Masanori Hara ◽  
Jungi Inukai ◽  
Kingo Itaya
Keyword(s):  
High Resolution ◽  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
High Resolution Imaging ◽  
Tunneling Microscopy ◽  
Resolution Imaging

scholarly journals Can Dew Help us to Image Insulating Material?

1995 ◽  
Vol 3 (1) ◽  
pp. 18-21
Author(s):  
Stephen W. Carmichael
Keyword(s):  
High Resolution ◽  
Scanning Tunneling Microscopy ◽  
Electron Flow ◽  
Scanning Tunneling ◽  
High Resolution Imaging ◽  
Tunneling Microscopy ◽  
Insulating Material ◽  
Metal Atoms ◽  
New Development ◽  
Resolution Imaging

In high resolution imaging of biologic structure, atomic lorce microscopy (AFM) has been prevailing over scanning tunneling microscopy (STM). This is primarily because biologic materials do not conduct electricity, and STM requires that electrons flow to or from the surface of the specimen, whereas electron flow is not required for AFM. Microscopists intent on using STM have compensated by coating specimens with a thin coat of metal. However, the presence of metal atoms on the surface degrades the resolution. A new development may make STM more useful to biologists than ever before.

High-Resolution Imaging of the Intramolecular Structure of Indomethacin−Carrying Dendrimers by Scanning Tunneling Microscopy

ACS Nano ◽  
2011 ◽  
Vol 5 (3) ◽  
pp. 1685-1692 ◽  
Author(s):  
Christopher J. Fleming ◽  
Nai-Ning Yin ◽  
Shawn L. Riechers ◽  
Gabriel Chu ◽  
Gang-yu Liu
Keyword(s):  
High Resolution ◽  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
High Resolution Imaging ◽  
Tunneling Microscopy ◽  
Resolution Imaging

scholarly journals High-Resolution Imaging with Atomic Force Microscopy

2004 ◽  
Vol 12 (5) ◽  
pp. 12-15
Author(s):  
Sergei Magonov
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
High Resolution Imaging ◽  
Tunneling Microscopy ◽  
Detection Scheme ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resolution Imaging

The invention of scanning tunneling microscopy (STM) in 1982 revolutionized surface analysis by providing atomic-scale surface imaging of conducting and semiconducting materials. Shortly after that, atomic force microscopy (AFM) was introduced as an accessory of STM for high-resolution imaging of surfaces independent of their conductivity. Mechanical force interactions between a sharp tip placed at one end of a micro fabricated cantilever and a sample surface were employed for imaging in this method. In the past decade, AFM has developed into a leading scanning probe technique applied in many fields of fundamental and industrial research. The progress of AFM has been made possible by implementation of an optical level detection scheme, which allows precise measuring of the cantilever deflection caused by the tip-sample forces, by mass microfabrication of probes consisting of cantilevers, and by developments of oscillatory imaging modes, particularly, Tapping ModeTM.

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