High-Fidelity Self-Assembly of Crystalline and Parallel-Oriented Organic Thin Films by π–π Stacking from a Metal Surface

Langmuir ◽  
2014 ◽  
Vol 30 (33) ◽  
pp. 10050-10056 ◽  
Author(s):  
Daniel Skomski ◽  
Junyong Jo ◽  
Christopher D. Tempas ◽  
Seyong Kim ◽  
Dongwhan Lee ◽  
...  
Author(s):  
Chengzhi Cai ◽  
Martin Bösch ◽  
Christian Bosshard ◽  
Bert Müller ◽  
Ye Tao ◽  
...  

2019 ◽  
Vol 7 (21) ◽  
pp. 1900749 ◽  
Author(s):  
María José Aliaga‐Gosalvez ◽  
Nicola Demitri ◽  
Michael Dohr ◽  
Juan Carlos Roldao ◽  
Sang Kyu Park ◽  
...  

2001 ◽  
Vol 66 (2) ◽  
pp. 391-399 ◽  
Author(s):  
Simon J. Holder ◽  
Johannes A. A. W. Elemans ◽  
Jack J. J. M. Donners ◽  
Mark J. Boerakker ◽  
René de Gelder ◽  
...  

1998 ◽  
Vol 120 (33) ◽  
pp. 8563-8564 ◽  
Author(s):  
Chengzhi Cai ◽  
Martin M. Bösch ◽  
Ye Tao ◽  
Bert Müller ◽  
Zhehong Gan ◽  
...  

Langmuir ◽  
2017 ◽  
Vol 33 (8) ◽  
pp. 1751-1762 ◽  
Author(s):  
Pawilai Chinwangso ◽  
Han Ju Lee ◽  
Andrew C. Jamison ◽  
Maria D. Marquez ◽  
Chul Soon Park ◽  
...  

2010 ◽  
Vol 20 (13) ◽  
pp. 2493 ◽  
Author(s):  
Giovanna De Luca ◽  
Emanuele Treossi ◽  
Andrea Liscio ◽  
Jeffrey M. Mativetsky ◽  
Luigi Monsù Scolaro ◽  
...  

2019 ◽  
Vol 10 (23) ◽  
pp. 3194-3200 ◽  
Author(s):  
Helen Tran ◽  
Harrison M. Bergman ◽  
Kaia R. Parenti ◽  
Arend M. van der Zande ◽  
Cory R. Dean ◽  
...  

We describe the development of a technique to transfer micrometer patterns of organic thin films with sub-50 nm edge resolution and sub-20 nm pattern fidelity.


2007 ◽  
Vol 43 (4) ◽  
pp. 239-242
Author(s):  
S. Kh. Suleimanov ◽  
O. A. Dudko ◽  
V. G. Dyskin ◽  
Z. S. Settarova ◽  
M. U. Dzhanklych

2020 ◽  
Vol 13 (4) ◽  
pp. 866-872
Author(s):  
HAO Ya-ru ◽  
◽  
◽  
DENG Zhao-qi

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