Synthesis and Characterization of DMAP-Stabilized Aryl(silylene) Complexes and (Arylsilyl)(DMAP) Complexes of Tungsten: Mechanistic Study on the Interconversion between These Complexes via 1,2-Aryl Migration

2009 ◽  
Vol 28 (6) ◽  
pp. 1791-1799 ◽  
Author(s):  
Eiji Suzuki ◽  
Takashi Komuro ◽  
Masaaki Okazaki ◽  
Hiromi Tobita
Keyword(s):  
Synthesis And Characterization ◽  
Mechanistic Study ◽  
Silylene Complexes

Synthesis and Characterization of IrH2{Si(OTf)Ph2}(TFB)(PR3) (PR3= PiPr3, PCy3):  First Base-Stabilized Silylene Complexes of Iridium

1996 ◽  
Vol 15 (8) ◽  
pp. 2185-2188 ◽  
Author(s):  
Wanzhi Chen ◽  
Andrew J. Edwards ◽  
Miguel A. Esteruelas ◽  
Fernando J. Lahoz ◽  
Montserrat Oliván ◽  
...  
Keyword(s):  
Synthesis And Characterization ◽  
Silylene Complexes

scholarly journals Synthesis and Characterization of Methoxy-bridged Bis(silylene)tungsten Complexes

2011 ◽  
Vol 4 (1) ◽  
pp. 109 ◽  
Author(s):  
R. Begum ◽  
S. M. S. Islam
Keyword(s):  
Elemental Analysis ◽  
Oxidative Addition ◽  
Metal Center ◽  
Synthesis And Characterization ◽  
29Si Nmr ◽  
Mechanism Of Formation ◽  
Tungsten Complexes ◽  
Plausible Mechanism ◽  
Silylene Complexes

Synthesis of two methoxy bridged bis(silylene) complexes (CpMe4)W(CO)2 {(Et2Si)••OMe••(SiMe2)}(3) and (CpMe)W(CO)2 {(Et2Si)••OMe••(SiMe2)}(4) have been synthesized. Both the compounds contain chiral tungsten center and formed via oxidative addition of an Si-H bond to a coordinatively unsaturated metal center. The complexes were characterized by 1H, 13C, 29Si NMR, IR and elemental analysis. A plausible mechanism of formation is also suggested.Keywords:  Coordinatively unsaturated; Chiral tungsten; Oxidative addition.© 2012 JSR Publications. ISSN: 2070-0237 (Print); 2070-0245 (Online). All rights reserved.doi: http://dx.doi.org/10.3329/jsr.v4i1.7890J. Sci. Res. 4 (1), 109-118 (2012)

Synthesis and study of platinum silylene complexes of the type (R3P)2Pt=SiMes2 (Mes = 2,4,6-trimethylphenyl)

2003 ◽  
Vol 81 (11) ◽  
pp. 1127-1136 ◽  
Author(s):  
Jay D Feldman ◽  
Gregory P Mitchell ◽  
Jörn-Oliver Nolte ◽  
T Don Tilley
Keyword(s):  
Oxidative Addition ◽  
Reductive Elimination ◽  
Synthesis And Characterization ◽  
Silylene Complexes

The synthesis and characterization of neutral platinum silylene complexes (R3P)2Pt=SiMes2 (R = i-Pr (1) or cyclohexyl (2), Mes = 2,4,6-trimethylphenyl) is reported. The dimesitylsilylene ligand in 2 is displaced by a number of ligands including phosphines, alkenes, alkynes, and O2. Complex 2 reacts with ROH substrates (R = H, Me, Et) to give (Cy3P)2Pt and Mes2Si(OR)(H) and with H2 to give trans-(Cy3P)2Pt(H)SiHMes2 (3). Reaction of H2SiMes2 with (Cy3P)2Pt gave cis-(Cy3P)2Pt(H)SiHMes2 (4). EXSY NMR experiments of 4 reveal that exchange of silicon and platinum hydrides occurs via reductive elimination – oxidative addition and not via a silylene intermediate.Key words: silylene, EXSY, platinum, hydride.

Synthesis and Characterization of the Three Dicyclopentapyrenes

1996 ◽  
Vol 61 (10) ◽  
pp. 3572-3572
Author(s):  
Lawrence T. Scott ◽  
Atena Necula
Keyword(s):  
Synthesis And Characterization

Synthesis and characterization of TiN / Ti / AISI 410 coatings

2018 ◽  
Vol 2 (1) ◽  
pp. 7
Author(s):  
S Chirino ◽  
Jaime Diaz ◽  
N Monteblanco ◽  
E Valderrama
Keyword(s):  
Synthesis And Characterization ◽  
Photoemission Spectroscopy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Columnar Grains ◽  
Tin Thin Films ◽  
Steel Aisi ◽  
Interacting Surfaces ◽  
Stainless Steel Aisi

The synthesis and characterization of Ti and TiN thin films of different thicknesses was carried out on a martensitic stainless steel AISI 410 substrate used for tool manufacturing. The mechanical parameters between the interacting surfaces such as thickness, adhesion and hardness were measured. By means of the scanning electron microscope (SEM) the superficial morphology of the Ti/TiN interface was observed, finding that the growth was of columnar grains and by means of EDAX the existence of titanium was verified.  Using X-ray diffraction (XRD) it was possible to observe the presence of residual stresses (~ -3.1 GPa) due to the different crystalline phases in the coating. Under X-ray photoemission spectroscopy (XPS) it was possible to observe the molecular chemical composition of the coating surface, being Ti-N, Ti-N-O and Ti-O the predominant ones.

Sign in / Sign up

Export Citation Format

Share Document