scholarly journals Statistical analysis of solar EUV and X-ray flux enhancements induced by solar flares and its implication to upper atmosphere

2011 ◽  
Vol 116 (A11) ◽  
pp. n/a-n/a ◽  
Author(s):  
Huijun Le ◽  
Libo Liu ◽  
Han He ◽  
Weixing Wan
2021 ◽  
Vol 366 (1) ◽  
Author(s):  
Bo Xiong ◽  
Ting Wang ◽  
Xiaolin Li ◽  
Yunxing Yin

1990 ◽  
Vol 142 ◽  
pp. 409-413
Author(s):  
V. G. Kurt

A statistical analysis of solar flare X-rays and interplanetary particle fluxes, measured onboard VENERA-13, 14 Spacecraft, was performed. The correlation of fluences for different manifestations of solar flares is strong, especially for fast electrons and hard and soft X-ray emissions. Frequency dependence on fluence value ϵi for practically all Kinds of solar flare emission can be described by power law ν (ϵ > ϵO) ∼ ϵ−0.45±0.15 which does not change significantly with solar activity. For different Hα flare importances the values of ϵi were obtained. It is proposed that appearance of certain energy flare frequency is strongly dependent on some scale factor.


1989 ◽  
Vol 104 (2) ◽  
pp. 161-164
Author(s):  
G. Pearce ◽  
R.A. Harrison

We undertake a statistical analysis of the soft X-ray (3.5 – 5.5 keV) profiles of solar flares as observed with the Hard X-ray Imaging Spectrometer on the SMM. The durations, maximum intensities and intensity profiles of the flares are examined. The properties of the “typical” solar flare are discussed. The distributions of the measured parameters with respect to one another reveal some interesting results. In common with past studies, we conclude that there is no evidence to suggest that more than one type of event is being viewed, despite a desire evident in the literature to place events into distinct groups. We also conclude that commonly held views about the relatonships between flare duration and intensity, profile asymmetries and intensity etc.. are in error. For more details of the flare events, the selection of data and the method of analysis, the reader is referred to Pearce and Harrison (1988).


2010 ◽  
Vol 15 (6) ◽  
pp. 538-546
Author(s):  
Navin Chandra Joshi ◽  
Neeraj Singh Bankoti ◽  
Seema Pande ◽  
Bimal Pande ◽  
Wahab Uddin ◽  
...  

New Astronomy ◽  
2010 ◽  
Vol 15 (6) ◽  
pp. 538-546 ◽  
Author(s):  
Navin Chandra Joshi ◽  
Neeraj Singh Bankoti ◽  
Seema Pande ◽  
Bimal Pande ◽  
Wahab Uddin ◽  
...  

1993 ◽  
Vol 208 (1) ◽  
pp. 99-111 ◽  
Author(s):  
G. Pearce ◽  
A. K. Rowe ◽  
J. Yeung

2003 ◽  
Vol 32 (12) ◽  
pp. 2483-2488
Author(s):  
C GOFF ◽  
S MATTHEWS ◽  
L HARRA
Keyword(s):  

Author(s):  
Fabian Jaeger ◽  
Alessandro Franceschi ◽  
Holger Hoche ◽  
Peter Groche ◽  
Matthias Oechsner

AbstractCold extruded components are characterized by residual stresses, which originate from the experienced manufacturing process. For industrial applications, reproducibility and homogeneity of the final components are key aspects for an optimized quality control. Although striving to obtain identical deformation and surface conditions, fluctuation in the manufacturing parameters and contact shear conditions during the forming process may lead to variations of the spatial residual stress distribution in the final product. This could lead to a dependency of the residual stress measurement results on the relative axial and circumferential position on the sample. An attempt to examine this problem is made by the employment of design of experiments (DoE) methods. A statistical analysis of the residual stress results generated through X-Ray diffraction is performed. Additionally, the ability of cold extrusion processes to generate uniform stress states is analyzed on specimens of austenitic stainless steel 1.4404 and possible correlations with the pre-deformed condition are statistically examined. Moreover, the influence of the coating, consisting of oxalate and a MoS2 based lubricant, on the X-Ray diffraction measurements of the surface is investigated.


Solar Physics ◽  
1986 ◽  
Vol 105 (1) ◽  
pp. 87-99 ◽  
Author(s):  
E. J. Schmahl ◽  
M. R. Kundu ◽  
F. T. Erskine
Keyword(s):  
X Ray ◽  

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