Determination of spatial and spectral distribution of neuron flux in the Texas A&M Nuclear Science Center reactor exposure cell

1976 ◽  
Author(s):  
R.F. Schumacher ◽  
J.D. Randall ◽  
K.A. Hardy ◽  
J.A. Bachman
Keyword(s):  
Spectral Distribution ◽  
Science Center ◽  
Nuclear Science

The Applied Science Center for Archaeology

1963 ◽  
Vol 29 (2) ◽  
pp. 237-239
Author(s):  
Froelich Rainey
Keyword(s):  
Trace Elements ◽  
Applied Science ◽  
Science Center ◽  
Precise Location ◽  
New Techniques ◽  
University Museum ◽  
The University ◽  
Further Development

AbstractThe Applied Science Center for Archaeology of the University Museum in Philadelphia is now experimenting with devices that will facilitate the task of precise location and even discovery of cultural strata. The Geohm resistometer and the proton magnetometer are both being used satisfactorily, and further development of a new sonic device has begun. The Center has also been studying new techniques for the determination of trace elements in metals and ceramics, and the thermoluminescence method for dating pottery and other fired objects. In cooperation with the already established radiocarbon laboratory, a project is underway to acquire and date tree samples of very great age. The Center is also gathering and cross-indexing information on completed analyses carried out with the various dating devices and techniques. This information is drawn from both published and unpublished materials.

scholarly journals Experimental Determination of Scan-truncation Losses from Low-temperature (16 K) Single-crystal X-ray Measurements

1988 ◽  
Vol 41 (3) ◽  
pp. 503 ◽  
Author(s):  
Riccardo Destro
Keyword(s):  
Low Temperature ◽  
Single Crystal ◽  
Experimental Determination ◽  
Least Squares ◽  
Spectral Distribution ◽  
Experimental Measurements ◽  
Fourier Methods ◽  
X Ray ◽  
Least Squares Fitting

Model intensity profiles have been obtained for biscarbonyl[ 14]annulene by convoluting the Mo Ka spectral distribution with two functions derived from experimental measurements at 16(1) K, up to 26Mo = 110�, of a spherical crystal mounted on a four-circle diffractometer equipped with the Samson low-temperature apparatus. The process includes accurate measurement of the inherent background, treatment of the profiles by numerical Fourier methods, and least-squares fitting. Owing to the instrumental configuration of the diffractometer used in this investigation, the first step of the process has required a careful determination of the X dependence of the background, besides the usual 26 dependence. Truncation losses for the crystal under study, evaluated for several scan ranges, are far larger than usually assumed or predicted.

Theoretical Calculation of Background in X-Ray Spectrometry for the Determination of Some Heavy Trace Elements

1991 ◽  
Vol 35 (B) ◽  
pp. 755-756
Author(s):  
Jean-Jacques Gruffat
Keyword(s):  
Trace Elements ◽  
Theoretical Calculation ◽  
Spectral Distribution ◽  
Geological Samples ◽  
X Ray ◽  
Correct Calculation ◽  
The Continuum

AbstractThe Kulenkampff-Kramers formula giving the spectral distribution of the continuum as a function of wavelength allows a correct calculation of background under the peak. It is only necessary to measure two backgrounds, one on each side of the peak, The true background under the peak is given by multiplying them by adequate coefficients and adding them up. This method has been applied to the determination of low amounts of Ce, La, Ba and Cs in geological samples.

Determination of Actual Peak Voltage from Recovered Spectral Distribution of Bremsstrahlung

2011 ◽  
Vol 45 (5) ◽  
pp. 171-173
Author(s):  
D. A. Muslimov ◽  
A. S. Lelyukhin ◽  
K. A. Gamaley
Keyword(s):  
Spectral Distribution ◽  
Peak Voltage
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