Substrate Damage in Film Thickness Measurement by Beam Interferometry

Nature ◽  
1959 ◽  
Vol 184 (4683) ◽  
pp. 354-355 ◽  
Author(s):  
G. DAVID SCOTT
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Author(s):  
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Qinggang Liu ◽  
Chong Yue ◽  
Yaopu Lang ◽  
Xinglin Zhou

MTZ worldwide ◽  
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Vol 83 (1) ◽  
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Author(s):  
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