Investigation of mechanisms of corrosion due to diffusion of impurities by direct current glow discharge mass spectrometry depth profiling

2000 ◽  
Vol 15 (11) ◽  
pp. 1479-1484 ◽  
Author(s):  
L. O. Actis-Dato ◽  
L. Aldave de Las Heras ◽  
M. Betti ◽  
E. H. Toscano ◽  
F. Miserque ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Glow Discharge ◽  
Direct Current ◽  
Depth Profiling ◽  
Glow Discharge Mass Spectrometry ◽  
Diffusion Of Impurities

Depth profiling of Hf-doped aluminide coating by glow-discharge mass spectrometry

2002 ◽  
Vol 33 (11) ◽  
pp. 3578-3582 ◽  
Author(s):  
L. M. He ◽  
J. D. Meyer ◽  
W. Y. Lee ◽  
K. Putyera ◽  
L. R. Walker
Keyword(s):  
Mass Spectrometry ◽  
Glow Discharge ◽  
Aluminide Coating ◽  
Depth Profiling ◽  
Glow Discharge Mass Spectrometry

scholarly journals Influence of polycrystalline material on crater shape optimization and roughness using low-power/low-pressure direct-current glow discharge mass spectrometry

2020 ◽  
Vol 35 (7) ◽  
pp. 1450-1457
Author(s):  
Gagan Paudel ◽  
Sergey Khromov ◽  
Martin Kasik ◽  
Hans Jørgen Roven ◽  
Marisa Di Sabatino
Keyword(s):  
Mass Spectrometry ◽  
Glow Discharge ◽  
Low Power ◽  
Shape Optimization ◽  
Direct Current ◽  
Polycrystalline Material ◽  
Low Pressure ◽  
Glow Discharge Mass Spectrometry ◽  
Crater Bottom ◽  
Crater Shape

It is likely that observation of roughness at crater bottom upon GDMS sputtering is due to differential sputtering of grains.

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