scholarly journals Thin film depth profiling by ion beam analysis

The Analyst ◽  
2016 ◽  
Vol 141 (21) ◽  
pp. 5944-5985 ◽  
Author(s):  
Chris Jeynes ◽  
Julien L. Colaux
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Ion Beam ◽  
Depth Profiling ◽  
Functional Materials ◽  
Central Importance ◽  
Ion Beam Analysis ◽  
Beam Analysis

The analysis of thin films is of central importance for functional materials, including the very large and active field of nanomaterials.

scholarly journals Ion Beam Analysis for the Investigation of Diffusion Processes

2020 ◽  
Vol 13 ◽  
pp. 51
Author(s):  
H.-W. Becker
Keyword(s):  
Diffusion Processes ◽  
Ion Beam ◽  
Depth Profiling ◽  
Depth Resolution ◽  
Ion Beam Analysis ◽  
Beam Analysis ◽  
Diffusion Studies ◽  
New Applications ◽  
Diffusion Of Hydrogen ◽  
High Depth

The unique advantages of ion beam analysis, such as the depth resolved unam- biguous stoichometric information of RBS or the possibility to detect hydrogen with high depth resolution still opens new applications in fundamental as well as applied science. Two examples are presented here.The diffusion of hydrogen in cement during the formation of cement has been studied with the 15N hydrogen depth profiling. It could be shown, that the known stages of the hydration process are correlated with the diffusion of hydrogen on a nanometer scale.Diffusion processes play also an important role in geology. The investigation of such processes with RBS will be presented. Prospects of diffusion studies using isotopie tracing with low lying resonances will be discussed.

Oxygen uptake of InN thin films as determined by ion beam analysis

2007 ◽  
Vol 515 (7-8) ◽  
pp. 3736-3739 ◽  
Author(s):  
S.M. Durbin ◽  
P.A. Anderson ◽  
A. Markwitz ◽  
J. Kennedy
Keyword(s):  
Thin Films ◽  
Oxygen Uptake ◽  
Ion Beam ◽  
Ion Beam Analysis ◽  
Beam Analysis

Ion-beam analysis of phospholipid thin films deposited on c-Si

1999 ◽  
Vol 159 (1-2) ◽  
pp. 67-74 ◽  
Author(s):  
T. Som ◽  
T.K. Khan ◽  
P. Gupta-Bhaya ◽  
S. Kumar ◽  
V.N. Kulkarni
Keyword(s):  
Thin Films ◽  
Ion Beam ◽  
Ion Beam Analysis ◽  
Beam Analysis
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