COMPOSITIONAL DEPTH PROFILING IN SOLAR ENERGY MATERIALS USING MEV ION BEAM ANALYSIS

1988 ◽  
pp. 173-180
Author(s):  
C Jeynes
2020 ◽  
Vol 13 ◽  
pp. 51
Author(s):  
H.-W. Becker

The unique advantages of ion beam analysis, such as the depth resolved unam- biguous stoichometric information of RBS or the possibility to detect hydrogen with high depth resolution still opens new applications in fundamental as well as applied science. Two examples are presented here.The diffusion of hydrogen in cement during the formation of cement has been studied with the 15N hydrogen depth profiling. It could be shown, that the known stages of the hydration process are correlated with the diffusion of hydrogen on a nanometer scale.Diffusion processes play also an important role in geology. The investigation of such processes with RBS will be presented. Prospects of diffusion studies using isotopie tracing with low lying resonances will be discussed.


Author(s):  
F.J. Ager ◽  
M.A. Respaldiza ◽  
A. Paúl ◽  
J.A. Odriozola ◽  
M.F. da Silva ◽  
...  

1992 ◽  
Vol 10 (4) ◽  
pp. 2685-2690 ◽  
Author(s):  
J. A. Knapp ◽  
J. C. Barbour ◽  
B. L. Doyle

The Analyst ◽  
2016 ◽  
Vol 141 (21) ◽  
pp. 5944-5985 ◽  
Author(s):  
Chris Jeynes ◽  
Julien L. Colaux

The analysis of thin films is of central importance for functional materials, including the very large and active field of nanomaterials.


2001 ◽  
Vol 15 (28n29) ◽  
pp. 1271-1280
Author(s):  
I. C. VICKRIDGE

The accelerator laboratory of the Groupe de Physique des Solides, Paris, has pioneered a number of IBA techniques and applications over the last few decades. In particular, in the 1960's and 1970's, Nuclear Reaction analysis (NRA) including nuclear resonance depth profiling, isotopic tracing combined with NRA, and channelling techniques were developed under the leadership of G. Amsel. In this paper I will present a selection of recent applications from this laboratory of NRA, isotopic tracing with stable isotopes, and ion channelling, intended to illustrate the present status of these techniques in condensed matter physics and materials science, and to act as a backdrop for a discussion of future directions for development of Ion Beam Analysis in condensed matter physics and advanced materials research.


1989 ◽  
Vol 65 (2-3) ◽  
pp. 151-157
Author(s):  
K. Ishii ◽  
S. Morita

Sign in / Sign up

Export Citation Format

Share Document