Synthesis and characterization of a Bi10O8(OAr)16 oxo-cluster supported by p-tert-butylcalix[5]arene ligands

2016 ◽  
Vol 45 (34) ◽  
pp. 13399-13405 ◽  
Author(s):  
Daniel Mendoza-Espinosa

Wet [tBuC5(Bn)(H)4] ligand reacts with excess of Bi[N(SiMe3)2]3 to yield the dimeric complex 1 [Bi{tBuC5(Bn)(H)}]2 and cluster 2 [Bi10O8{tBuC5(Bn)(H)}4]. Complex 2 features multicoordinated bismuth(iii) centers in an overall Bi10O8(OAr)16 core which represents the largest bismuth oxo-cluster supported by calix[n]arene ligands to date.

2017 ◽  
Vol 73 (9) ◽  
pp. 754-759
Author(s):  
C. Jandl ◽  
S. Stegbauer ◽  
A. Pöthig

We report the synthesis and characterization of a novel 4-(dimethylamino)pyridinium-substituted η3-cycloheptatrienide–Pd complex which is free of halide ligands. Diacetonitrile{η3-[4-(dimethylamino)pyridinium-1-yl]cycloheptatrienido}palladium(II) bis(tetrafluoroborate), [Pd(C2H3N)2(C14H16N2)](BF4)2, was prepared by the exchange of two bromide ligands for noncoordinating anions, which results in the empty coordination sites being occupied by acetonitrile ligands. As described previously, exchange of only one bromide leads to a dimeric complex, di-μ-bromido-bis({η3-[4-(dimethylamino)pyridinium-1-yl]cycloheptatrienido}palladium(II)) bis(tetrafluoroborate) acetonitrile disolvate, [Pd2Br2(C14H16N2)2](BF4)2·2CH3CN, with bridging bromide ligands, and the crystal structure of this compound is also reported here. The structures of the cycloheptatrienide ligands of both complexes are analogous to the dibromide derivative, showing the allyl bond in the β-position with respect to the pyridinium substituent. This indicates that, unlike a previous interpretation, the main reason for the formation of the β-isomer cannot be internal hydrogen bonding between the cationic substituents and bromide ligands.


2002 ◽  
Vol 41 (23) ◽  
pp. 5986-6000 ◽  
Author(s):  
Daniel R. Evans ◽  
Mingsheng Huang ◽  
James C. Fettinger ◽  
Tracie L. Williams

1996 ◽  
Vol 61 (10) ◽  
pp. 3572-3572
Author(s):  
Lawrence T. Scott ◽  
Atena Necula

2018 ◽  
Vol 2 (1) ◽  
pp. 7
Author(s):  
S Chirino ◽  
Jaime Diaz ◽  
N Monteblanco ◽  
E Valderrama

The synthesis and characterization of Ti and TiN thin films of different thicknesses was carried out on a martensitic stainless steel AISI 410 substrate used for tool manufacturing. The mechanical parameters between the interacting surfaces such as thickness, adhesion and hardness were measured. By means of the scanning electron microscope (SEM) the superficial morphology of the Ti/TiN interface was observed, finding that the growth was of columnar grains and by means of EDAX the existence of titanium was verified.  Using X-ray diffraction (XRD) it was possible to observe the presence of residual stresses (~ -3.1 GPa) due to the different crystalline phases in the coating. Under X-ray photoemission spectroscopy (XPS) it was possible to observe the molecular chemical composition of the coating surface, being Ti-N, Ti-N-O and Ti-O the predominant ones.


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