Imaging oxygen molecular adsorption and dissociation on the Ti site of rutile TiO2(110) surface with real configuration at 78 K by atomic force microscopy

2020 ◽  
Vol 22 (35) ◽  
pp. 19795-19801
Author(s):  
Huan Fei Wen ◽  
Hongqian Sang ◽  
Yasuhiro Sugawara ◽  
Yan Jun Li
Keyword(s):  
Atomic Force Microscopy ◽  
Molecular Adsorption ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force ◽  
Adsorption And Dissociation

Transition and dissociation of adsorbed O2 with three different configurations are directly observed at 78 K by atomic force microscopy.

scholarly journals Characterization of individual molecular adsorption geometries by atomic force microscopy: Cu-TCPP on rutile TiO2 (110)

2015 ◽  
Vol 143 (9) ◽  
pp. 094202 ◽  
Author(s):  
Res Jöhr ◽  
Antoine Hinaut ◽  
Rémy Pawlak ◽  
Ali Sadeghi ◽  
Santanu Saha ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Molecular Adsorption ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force

A study of molecular adsorption of a cationic surfactant on complex surfaces with atomic force microscopy

The Analyst ◽  
2016 ◽  
Vol 141 (3) ◽  
pp. 1017-1026 ◽  
Author(s):  
I. Sokolov ◽  
G. Zorn ◽  
J. M. Nichols
Keyword(s):  
Atomic Force Microscopy ◽  
Cationic Surfactant ◽  
Solid Surfaces ◽  
Molecular Adsorption ◽  
Complex Surfaces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Broad Interest

The study of molecular adsorption on solid surfaces is of broad interest.

Tip-Induced Control of Charge and Molecular Bonding of Oxygen Atoms on the Rutile TiO2 (110) Surface with Atomic Force Microscopy

ACS Nano ◽  
2019 ◽  
Vol 13 (6) ◽  
pp. 6917-6924 ◽  
Author(s):  
Yuuki Adachi ◽  
Huan Fei Wen ◽  
Quanzhen Zhang ◽  
Masato Miyazaki ◽  
Yasuhiro Sugawara ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force ◽  
Molecular Bonding ◽  
Oxygen Atoms

Direct observation of atomic step edges on the rutile TiO2(110)-(1 × 1) surface using atomic force microscopy

2018 ◽  
Vol 20 (44) ◽  
pp. 28331-28337 ◽  
Author(s):  
Huan Fei Wen ◽  
Masato Miyazaki ◽  
Quanzhen Zhang ◽  
Yuuki Adachi ◽  
Yan Jun Li ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Atomic Step ◽  
Atomic Configuration ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force ◽  
Step Edges

Clarifying the atomic configuration of step edges on a rutile TiO2 surface is crucial for understanding its fundamental reactivity, and the direct observation of atomic step edges is still a challenge.

Characterization and Reversible Migration of Subsurface Hydrogen on Rutile TiO2(110) by Atomic Force Microscopy at 78 K

2019 ◽  
Vol 123 (36) ◽  
pp. 22595-22602 ◽  
Author(s):  
Quanzhen Zhang ◽  
Huan Fei Wen ◽  
Yuuki Adachi ◽  
Masato Miyazaki ◽  
Yasuhiro Sugawara ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force

Electrical Engineering of the Oxygen Adatom and Vacancy on Rutile TiO2(110) by Atomic Force Microscopy at 78 K

2019 ◽  
Vol 123 (47) ◽  
pp. 28852-28858 ◽  
Author(s):  
Quanzhen Zhang ◽  
Huan Fei Wen ◽  
Yuuki Adachi ◽  
Masato Miyazaki ◽  
Yasuhiro Sugawara ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Engineering ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force

Identification of Atomic Defects and Adsorbate on Rutile TiO2(110)-(1 × 1) Surface by Atomic Force Microscopy

2019 ◽  
Vol 123 (42) ◽  
pp. 25756-25760 ◽  
Author(s):  
Huan Fei Wen ◽  
Yuuki Adachi ◽  
Quanzhen Zhang ◽  
Masato Miyazaki ◽  
Yasuhiro Sugawara ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Atomic-scale topography of rutile TiO2(110) in aqueous solutions: A study involving frequency-modulation atomic force microscopy

2020 ◽  
Vol 152 (5) ◽  
pp. 054703 ◽  
Author(s):  
Shengkai Xue ◽  
Akira Sasahara ◽  
Hiroshi Onishi
Keyword(s):  
Atomic Force Microscopy ◽  
Aqueous Solutions ◽  
Frequency Modulation ◽  
Atomic Scale ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Manipulation of C60 islands on the rutile TiO2 (110) surface using noncontact atomic force microscopy

2009 ◽  
Vol 95 (4) ◽  
pp. 043110 ◽  
Author(s):  
Felix Loske ◽  
Angelika Kühnle
Keyword(s):  
Atomic Force Microscopy ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force
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